J microTechnology offers low-cost inspection probe

The NAT-31 inspection system works with J microTechnology’s probe station. (Photo: J microTechnology)

June 18, 2007 — J microTechnology, Inc., specialists in electrical and mechanical test products for advanced semiconductor and packaged devices, has introduced the NAT-31 42X-540X Microscope Inspection System with USB 2.0 camera. The $7000 system, based on high-clarity zoom optics, resolves features of 1 micron or less when added to a J microTechnology probe station, thus providing a cost-effective, versatile solution for clinical, life science, materials science, semiconductor, and education professionals.

The system’s zoom optics have a 0.7X-4.5X objective lens providing magnification of 42X-270X for probe placement and device under test (DUT) alignment with the standard 0.5X auxiliary lens. Removal of the auxiliary lens changes the range of magnification to 84X-540X for inspection and fine geometry probing. It comes with a 2X relay lens and a 0.5X or 1.0X (no lens) objective multiplier. A long working distance — of 108mm (4.25″) for the 540X optics and 189mm (7.4″) for the 270X option — allows for flexibility with fixtures.

“This product was requested by our university customers who wanted to be able to use our probe stations and needed both normal probe placement magnification and high power magnification, but didn’t want the expense of a short working distance optical viewing microscope,” said Louis Schappacher, applications specialist for J microTechnology.


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