July 27, 2007 — Keithley Instruments, Inc., provider of solutions for emerging measurement needs, has entered into a Joint Development Partnership (JDP) surrounding semiconductor device material testing technology with France’s CEA Leti semiconductor development laboratories. Keithley and CEA Leti will research methods for characterizing advanced semiconductor materials and devices that support DC, high frequency, and RF-level signals on both micro- and nano-level structures. CEA Leti will use Keithley RF-enabled semiconductor test equipment as part of its broad portfolio of research projects in order to expand and enhance understanding of the performance of semiconductor devices that perform at the highest levels.

“As semiconductor technology pushes the upper limits to achieving RF-level signals and device miniaturization to nano levels, measurement technology must not only keep pace but even lead researchers’ ability to build and test these devices,” explained Mark Hoersten, Keithley vice president, business management. “Our partnership with CEA Leti is a unique opportunity to create new measurement technology at the point where many of our customers’ technologies converge – semiconductor, RF/wireless, and nanotechnology.”