July 19, 2007 – SUSS MicroTec AG has introduced the iVista high-resolution digital microscope targeting wafer-level testing applications such as device characterization, reliability test and failure analysis.
The tool can deliver images with sharpness comparable 10-megapixel color CCD, with up to 40x digital zooming to provide details (not just pixilated images) for tiny features. Users can save full-resolution images and multiview screens for documentation. The system also provides accurate point-to-point measurement and navigation using standard objectives, eliminating the need to buy additional objectives or auto-recognition adapters, the company says.
Other software features are included in SUSS’ Spectrum Vision system, including a multiview mode to create freely-defined regions that are magnified and displayed alongside the main view; and a multi-cam imaging that displays a live image from a separate camera alongside the live image from the iVista microscope — for example, to monitor contact height while observing the position of the wafer and probe tips.
The iVista is available as a manual station or as a stand alone microscope, and can be fully integrated with SUSS semiautomatic probe stations.