GE Inspection adds nanoscale capabilities with phoenix|x-ray acquisition

August 28, 2007 — GE Inspection Technologies has signed a definitive agreement to acquire phoenix|x-ray, developer of high-resolution computed tomography (CT) / X-ray technology used in non-destructive testing (NDT) applications.

The acquisition broadens GE’s NDT offerings, adding 3D computed tomography, micro- and nanotechnology systems to the company’s portfolio. This expanded technology suite will serve a wide variety of GE’s customers in the aerospace, power generation, oil & gas, automotive, industrial, and microelectronics industries.

“Phoenix|x-ray has a strong reputation in the non-destructive testing world and is a highly complementary addition to GE Inspection Technologies’ X-ray product line,” said Caroline Reda, President & CEO of GE Inspection Technologies. “The acquisition will enhance GE’s technology in X-ray testing machines, adding CT capability that has a much finer resolution than our current GE technology. This resolution capability for metal and composite imaging is integral to our mission to provide customers with a broad portfolio of high-tech and valuable non-destructive testing solutions.”

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