The XGT-7000 XRF imaging microscope with 10 μm resolution. (Photo: Horiba)

September 12, 2007 — Horiba Jobin Yvon‘s XGT-7000 is the latest entry in the company’s XGT series of energy dispersive x-ray fluorescence (EDXRF) microscopes. The instrument promises fast, high-sensitivity qualitative and quantitative elemental analysis and imaging, transmission x-ray imaging, and dual vacuum modes, and comes with dedicated imaging acquisition/analysis software.

The new XGT-7000 targets all applications that benefit from nondestructive analysis of discrete microscopic particles and high spatial resolution element imaging, including forensic science, pharmaceutics, materials, engine wear analysis, geology, museums, archaeology, electronics, and life sciences. A choice of two x-ray beam diameters is available, ranging from 1.2 mm through to a “world-leading” 10 µm; and beams can be switched in a matter of seconds, for flexibility.

The instrument’s unique dual vacuum modes offer enable control for varied analyses. The Full Vacuum mode provides the highest sensitivity for light elements such as sodium, magnesium and aluminium. However, for water containing samples such as biological cells and fragile archaeological objects which can be damaged by vacuum conditions, a localized vacuum mode allows the full elemental range from sodium to uranium to be analysed with the sample chamber maintained at normal atmospheric pressure.

The XGT-7000’s SmartMap software leads the user through project set up, experiment configuration, acquisition and data analysis, and modules such as auto peak labelling, spectral searching, FPM and calibrated quantification and report generation are easily accessed. Elemental images can be generated post-acquisition and adjusted at will, ensuring that the potential of the information rich element image data can be fully utilized.