MCP Memory Test

The system is claimed to bridge gaps between engineering workstations and high-volume production testers. It integrates with a probe or handler for automatic testing, supports use with thermal environment chambers for harsh temperature characterization, and reportedly reduces test time for 1,000 sample units to as little as seven hours. With a small footprint, it supports V5000e test programs and processes. The Matrix addition increases pin count from 128 to 768, enabling a range of testing procedures. Verigy, Cupertino, CA,


Easily post a comment below using your Linkedin, Twitter, Google or Facebook account. Comments won't automatically be posted to your social media accounts unless you select to share.