Takumi, Chartered validating DFM software at 65nm

September 21, 2007 – Takumi Technology Corp. and Singapore foundry Chartered Semiconductor Manufacturing Ltd. are working to validate Takumi’s DFM optimization software for Chartered’s implementation of the 65nm process developed by the Common Platform Alliance (IBM, Chartered, Samsung, et al).

Patterns tested on wafers made with 65nm process technology and evaluated by Takumi’s Enhance software “showed opportunities for gate CD variation improvement and enhanced detection of lithography-related violations,” the firms said in a statement, adding that they are also working to qualify the software with a 45nm process.

“Chartered is encouraged by our early, collaborative results with Takumi, and its potential direct benefit to customers from improved variation control to reduced violations, helping them to better meet their time-to-market windows,” stated Henry Law, VP of Chartered’s design services division.


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