September 28, 2007 — The University of Alabama and Imago Scientific Instruments have announced plans to establish a new research facility for atom probe tomography.
Atom-probe tomography, also known as LEAP microscopy, provides very high spatial resolution combined with compositional analysis and high sensitivity. It allows materials-research scientists to analyze specimens in three dimensions with atomic resolution, offering key insights into how a material’s atomic structure affects its mechanical and electrical properties.
“Through the LEAP’s analysis, researchers can better design materials with tailored properties for such applications as transistors used in cell phones, hard drives for computers, or high strength, low-weight steels used for fuel efficient automobiles,” Gregory Thompson, assistant professor of metallurgical and materials engineering at UA, said in a news release
Mike Bersch, director of UA’s Central Analytical Facility said the LEAP will be the “instrument of choice for semiconductor analysis.”
The university and Imago have agreed to work jointly on projects.