October 18, 2007 – The Semiconductor Test Consortium (STC), the automated test equipment group touting the Openstar test interface, says it has the first draft of terminology specifications for another initiative targeting interface extensions.

Earlier this year the STC’s Docking and Interface Working Group started work to establish standard terminology specifications targeting several areas including X-Y-Z axes regarding testhead orientation, convention for contact sight numbering, minimum set of docking interface connections, and defining the various interface levels for the testhead, loadboard, contactor, and handler. Efforts were split among five taskforce teams (24 members representing 14 companies) to apply the desired specs to probers, handlers, docking and interface, testers, and manipulators. Initial results for the consortium’s eXtensions initiative (STIX) are now being published.

The STC’s STIX initiative aims to encompass vendor- and architecture-agnostic, open hardware and software specifications for all peripheral areas around the ATE, enabling IDMs and outsourced SATS firms to achieve higher equipment utilization and easier line balancing, and help suppliers eliminate redundant R&D efforts in non-differentiating product areas.

The progress and cooperation on STIX “illustrates that important, long-term test challenges are being addressed effectively by working in the open and collaborative structure of the Semiconductor Test Consortium,” said Bob Helsel, STC manager, in a statement.

The STC will discuss more about its work with STIX and other activities at next week’s International Test Conference (ITC) in Santa Clara, CA.