Ambios introduces next-gen surface profilometers

The XP-Plus series consists of three different profilers (Photo: Ambios Technology)

November 5, 2007 — Ambios Technology, Inc., manufacturer of high-resolution surface measurement and visualization systems, has introduced a new family of surface profilometers. The XP-Plus Series consists of three different profilers, each designed to meet the diverse needs of research and manufacturing environments. They feature entirely new control electronics, software, and substantially improved performance specifications.

According to Ambios president and CEO Patrick O’Hara, the new instruments represent a substantial advancement in the state-of-the-art in surface profilometers. The series “is the culmination of nearly two years of research, product development, and field testing,” he said. “Our customers’ input was the impetus for the XP-Plus Series products, and is reflected in the features and performance of these next-generation products.”

In addition to surface profilometers, Ambios manufactures scanning white light interferometers and (AFM/SPM) scanning probe microscopes.

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