JEOL’s CarryScope is a mobile SEM with conventional capabilities

The CarryScope offers 8X to 300,000X imaging and up to 5.0nm resolution. (Photo: JEOL USA)

February 6, 2007 — JEOL USA has introduced a new mobile scanning electron microscope (SEM) that it says “can travel or easily be moved to different locations as needed.” In a research or manufacturing setting, the new CarryScope can be transported between the lab, conference room, or office for inspection of products or analysis of research samples. The CarryScope also enables “mobile crime labs” where imaging and analysis of trace evidence are conducted right at the crime scene.

JEOL says the CarryScope delivers several high resolution performance imaging and analytical capabilities of conventional electron microscopes, making it easy to observe high and low magnifications of fine surface structures and digitally record images. Standard features include 8X to 300,000X imaging and up to 5.0nm resolution. The CarryScope produces a sharp image that makes it possible to conduct and annotate high precision measurements on sub-micron structures.

An optional eucentric motorized specimen stage holds a specimen up to 150mm (6 inches) in diameter. Other options include low vacuum, EDS compatibility, and multiple live image display, including picture in picture. A stage navigation system and SmileShot software with smart settings for routine imaging further enhance the capabilities of this small footprint SEM.

JEOL USA will offer special pricing on the CarryScope until March 31, 2008; call 978-535-5900 for details.


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