Keithley, Stratosphere probe 65nm process variations

Feb. 11, 2008 – Keithley Instruments and Stratosphere Solutions say they are partnering to address advanced process development and monitoring using “array test element group” (TEG) technology, targeting sub-65nm manufacturing where tighter process monitoring is required to optimize IC performance and yields.

Together the firms say they will offer a “unique” characterization infrastructure for high volume, high throughput, and reliable parametric measurements, combining Keithley’s Series S600 parametric testers with Stratosphere’s “StratoPro” TEG IP.

“As technology advances to 45nm and below, more and more customers face the challenge of ramping parametric yield,” said Prashant Maniar, chief strategy officer of Stratosphere Solutions, in a statement. “Our tightly integrated, silicon-proven solution is a linchpin in empowering customers to drive parametric yield higher, reduce the cost of ramping parametric yield, accelerate test time, and improve ROI.”


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