Agilent’s New Cover-Extend Technology Eliminates Need for Physical Test Points for ICT

(March 21, 2008) Santa Clara, CA — Agilent Technologies Inc. has unveiled a limited access solution for In-Circuit Test (ICT) users that eliminates the need for physical test points, offering benefits that traditional VTEP test cannot provide. Part of Agilent’s VTEP v2.0 Powered test suite, the Agilent Cover-Extend Technology is a hybrid between two established test methodologies in the electronic manufacturing industry: Boundary Scan and VTEP Vectorless Test.

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