May 21, 2008 — Nanosensors (Neuchâtel, Switzerland), part of NanoWorld Holding AG, has introduced gold- and platinum-coated variations its AdvancedTEC SPM probe for atomic force microscopes (AFMs).

The platinum iridium and gold-coated probes will be available in different force constants and resonant frequencies for contact mode, noncontact/tapping mode, and force modulation mode measurements, the company announced in a news release.

The new variations extend the range of applications for the AdvancedTEC to electrostatic force mode (EFM), scanning electrochemical microscopy (SECM), scanning capacitance mode (SCM) and scanning Kelvin probe microscopy (SKPM), the company said.

The general advantage of AdvancedTEC is that this highly doped monolithic silicon probe is designed for precise positioning and high resolution imaging, the company said. A rectangular cantilever with a triangular free end and a protruding tetrahedral tip enables precise positioning and, according to the company, makes the AdvancedTEC the only scanning probe that offers real tip visibility through the optical system of the AFM — even when the probe is slightly tilted due to its mounting. This makes it suitable for nanomanipulation and other applications that require tip visibility. Because the AdvancedTEC tip is defined by crystal planes, it enables highly reproducible geometries and extremely smooth surfaces. And, its small half cone angles make it appropriate for samples that combine small pattern size with steep side walls. AdvancedTEC is lends itself to applications requiring direct optical access from the top or side — for illumination of the probe, the AFM tip, or the sample during measurement.

The Swiss Nanosensors is distinct from the Santa Clara, CA-based NanoSensors Inc., which is known for its e.coli detector.