September 2, 2008: Bruker AXS GmbH has completed the acquisition of Surface Imaging Systems GmbH (SIS), a developer of advanced atomic force/scanning probe microscopy (AFM/SPM) systems. SIS will be renamed Bruker Nano GmbH and will operate under its previous management.

SIS’ systems are used for numerous applications in materials research, including semiconductors, data storage, electronic materials, solar cells, polymers and catalysts. The core technology consists of extremely compact AFM/SPM components that can be used easily with many instruments, such as optical microscopes or micro-hardness testers, explained Frank Burgaezy, EVP of analysis tools developer Bruker AXS, in a statement.

“The most widely distributed SIS product is the ULTRAObjective, a compact AFM add-on unit which can be easily integrated with standard optical microscopes,” added SIS managing director Frank Saurenbach. “This straightforward integration provides direct access to the nanoworld, without compromise.”

The ULTRAObjective, the central part of all Bruker AFM stages, is a small and versatile AFM/SPM scanning head for integration into the turret of research microscopes and various OEM applications. (Photo: Business Wire)