November 21, 2008: Nanosensors has introduced the Akiyama-probe, developed in cooperation with the Institute of Microtechnology (IMT) at the University of Neuchâtel for the Nanosensors brand targeting specialized on cutting edge scanning probes for atomic force microscopy (AFM) applications.
The product — named to honor its inventor, Dr. Terunobu Akiyama — is a novel self-sensing and self-actuating probe based on a quartz tuning fork combined with a micromachined cantilever for dynamic mode AFM. It features a symmetrical arrangement of a U-shaped silicon cantilever attached to the two prongs of a quartz tuning fork. The tuning fork serves as an oscillatory force sensor that governs the tip vibration frequency as well as the amplitude and ensures a high mechanical Q-factor. The force constant of the probe is determined by the cantilever and can be adjusted independently from the resonance frequency.
The Akiyama-probe requires neither optical detection nor an external shaker. A-Probe occupies only a small volume above the sample. These features make it very attractive for creating a new generation of scanning probe microscopy (SPM) instruments.
Up to now the probe was only available to and via AFM manufacturers who sell instruments with A-probe capability. The Akiyama-probe is now available to end-customers via our regular distribution channels.