Nanosensors introduces carbon nanotube AFM probes

December 2, 2008: Nanosensors has added a carbon nanotube SPM probe to its scope of products.

The Nanosensors CNT probes are single/double wall carbon nanotube SPM probes with a tip diameter between 2-3 nm. Compared to other carbon nanotube probes available on the market today that are mostly multiwalled carbon nanotubes, the tip radius of Nanosensors carbon nanotube AFM tips is considerably smaller; they are therefore suitable for high-resolution measurements of nanometer-sized features.

The small tip radius achieved by a single or double wall carbon nanotube probe combined with the wear resistance of the CNT material compared to other materials makes it an ideal probe for high resolution imaging of flat surfaces, in Tapping Mode, or Non-Contact Mode operations in air or vacuum.

Due to their elastic properties single/double wall CNTs are useful on soft matter as well as on hard surfaces. Because of the same elastic properties however, Nanosensors’ single/double wall CNT probes are not suitable for measuring high aspect ratio features like very deep and narrow trenches or contact holes and should only be used by the experienced AFM user. They require special care to enable the user to profit from their unique properties and achieve good results.

The Nanosensors CNT probes will be available in package sizes of two and of five probes.


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