March 24, 2009: Nanoscience Instruments Inc., a distributor of nanotechnology instrumentation and supplies, has announced the worldwide distribution of NaugaNeedles’ new line of metallic atomic force microscopy (AFM) probes.
NaugaNeedles’ probes are the first commercial metallic needle AFM tips, according to a company news release. The needle is fabricated of Ag2Ga, and can be produced in varying lengths, diameters, and attachment angles. A combination of high aspect, consistent geometry, and high conductivity enables a wide range of new applications not previously possible.
The tips have many advantages over metal coated tips, particularly wear, the company said. As a metal coated silicon tip wears, it becomes unusable in a short period of time. As a metallic needle wears, both conductivity and imaging quality remain constant over a very long time. Additionally, the needle probes are very high aspect, providing greater sensitivity for EFM measurements.
Needle AFM tips are available in standard lengths of 1μm, 5μm, or 10μm with a diameter of 50nm. Customized needle tips up to 100μm long and 500nm in diameter can be provided. The standard angle of attachment is 12° but can also be customized to virtually any angle.
Metal needle AFM Tips from Nanoscience Instruments and NaugaNeedles. (Image courtesy of Nanoscience Instruments)