Agilent Technologies tweaks nano-test software

July 17, 2009: Agilent Technologies has launched a new version of its TestWorks software for its nanoindentation and tensile instruments to offer better imaging capabilities, survey scanning, and a new test method development environment.

Key specs of the software, now rebranded as “NanoSuite 5.0”:

  • New test method development offers easier, more user-friendly protocol scripting
  • Enhanced imaging capabilities: profile cross-sectional imaging, real-time adjustment of scanning parameters, polynomial distortion or leveling correction, plane-fit leveling
  • Survey scanning option allows scanning of areas up to 500μm × 500μm (flatness of travel 0.1%/100μm)
  • Experiment data analysis using the most powerful, comprehensive software

    “NanoSuite 5.0 immediately extends the impressive utility of Agilent G200 and G300 Nano Indenters, as well as that of Agilent T150 universal testing machines,” said Jeff Jones, operations manager for Agilent’s nanoinstrumentation facility in Chandler, AA, in a statement.

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