FEI uncrates SEMs, software for gunshot analysis

September 8, 2009:  FEI Co. has released two dedicated scanning electron microscopes (SEMs) and a new software package to help forensic scientists better analyze gunshot residues(GSR).

The new SEMs (GSR S50 and GSR F50) and software (Magnum) offer "dramatic improvements in speed, accuracy and affordability," completely automating analysis procedures with features including dedicated validation routines for accurate results and a "beam booster," the company says in a statement.

The S50 can image uncoated samples in low vacuum mode to preserve sample integrity; the F50 field emission source offers higher spatial resolution, putting more beam current into a smaller spot for faster and more precise X-ray analysis. Both SEMs include the new Magnum software, which uses their native imaging capabilities to locate particles instead of conventional X-ray particle imaging and detection. A specially designed beam current booster improves analysis speed and precision.Other features include built-in validation procedures using standard layouts of ENFSI proficiency tests, and compatibility with high count rate silicon drift X-ray detectors from Bruker and EDAX.


Easily post a comment below using your Linkedin, Twitter, Google or Facebook account. Comments won't automatically be posted to your social media accounts unless you select to share.