Gary Smith EDA market statistics 2010: Summary

(July 22, 2010) — These market statistics were compiled by Nancy Wu & Mary Olsson, part of the Gary Smith EDA team. The biggest change in 2009 was Mentor passing Cadence to become number two in product sales in EDA. This is an indication of the market shift caused by the move into the ESL Methodology. Synopsys remains a strong number one.

Mentor also grabbed #2 overall in IC design. With the acquisition of Valor, Mentor is also now 3× as large as its next competitor in PCB design.

We believe that the recent changes in Cadence has stopped their market share decline, similar to the changes made at Mentor, bringing in Walden Rhines, during the switch to the RTL design methodology.

Table. Market Share 2009. Note: All numbers show the best estimates of the Gary Smith EDA Analyst. Source: Gary Smith EDA (June 2010)
Rank  2008  2009  Growth, 2008-2009  Market share, 2009
Synopsys 1,227.40   1,250.45   1.9% 31.0%
Mentor Graphics 755.10 758.50   0.5% 18.8%
3   Cadence Design Systems    905.12      746.08   -17.6%  18.5%
Magma Design Automation       159.50      113.80   -28.7% 2.8%
Agilent EEsof       110.10      113.40   3.0% 2.8%
Other  1,074.15 1,051.56   -2.1% 26.1%
All companies 4,231.37   4,033.78   -4.5% 100.0%

Gary Smith EDA Market Statistics are a continuation of the Dataquest EDA Market Statistics that were started in 1985. Gary Smith EDA Market Statistics consist of Market Share, Market Forecast and Market Trends. In order to better serve the start-up community, Gary Smith EDA splits Market Trends into five reports. Basic Service consists or a minimum of one Markey Trend report and ten hours of Inquiry. For more information, visit

In this video interview from SEMICON West 2010, Walden Rhines, Mentor Graphics, discusses 3D technologies. EDA tools need to be extended to meet the needs of 3D — parasitic extraction and timing, place-and-route, and other steps are different with 3D. The tools are evolving for various 3D techs.

To watch a video interview with Segare Kekare, Synopsis, about rapid root cause analysis and process change validation using design-centric volume diagnostics, go to: Yield metrology looking at systematic failure mechanisms: Synopsis


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