Yield metrology looking at systematic failure mechanisms: Synopsis

(July 15, 2010) — In this video from SEMICON West 2010, Sagar Kekare, Synopsis, presents ideas from his paper on rapid root cause analysis and process change validation using design-centric volume diagnostics.

Get all the latest SEMICON West news and information at http://www.electroiq.com/index/Semiconductors/semiconwest2010.html

POST A COMMENT

Easily post a comment below using your Linkedin, Twitter, Google or Facebook account. Comments won't automatically be posted to your social media accounts unless you select to share.