Yield metrology looking at systematic failure mechanisms: Synopsis

(July 15, 2010) — In this video from SEMICON West 2010, Sagar Kekare, Synopsis, presents ideas from his paper on rapid root cause analysis and process change validation using design-centric volume diagnostics.


Get all the latest SEMICON West news and information at http://www.electroiq.com/index/Semiconductors/semiconwest2010.html


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