Docking and Mounting Interface Workgroup releases main goals

(August 5, 2010) — After a workgroup session at SEMICON West 2010 in San Francisco, the Docking and Mounting Interface Workgroup summarized its key goals. These include supply chain management and better time to market. Multitest’s business unit manager Günther Jeserer led the discussion.

The majority of attendees were suppliers of final semiconductor test equipment. Several equipment users, such as IDMs and test houses, also attended the workgroup and expressed their commitment. The workgroup defined the general goal of its activities as follows: 

  • Improve time to market
  • Improve efficiency and save cost 
  • Ease supply chain management

These targets must be achieved by reducing the complexity of the communication between equipment users and vendors, as well as minimizing the danger of miscommunication and communication errors.

Based on the recent workgroup, the next steps will be to work on standard terminology and reference points for the mechanical interfaces of probers, handlers, testers, dockings, contactors and load boards. All companies that use or supply test equipment are invited to actively contribute. A similar session will be held during SEMICON Europe in October 2010.

For more information about the Collaborative Alliance for Semiconductor Test (CAST), visit www.semi.org/cast

Read more about semiconductor test probes, handlers, and related equipment:

Multitest intros contactors for ICs with differential signals

MicroProbe debuts MEMS-based, multi-DUT, ultra-fine-pitch probe card for IC wafer test

Kelvin measurement using spring probes for packaged IC testing

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