AFM joining FIB/SEM analytical system? FEI and Nanonics plan to combine systems

(September 28, 2010) — FEI Company (NASDAQ: FEIC), an instrumentation company providing electron microscope systems, entered into an agreement to collaborate with Nanonics Imaging Ltd. to explore the feasibility of adding an atomic force microscope (AFM) to an FEI DualBeam focused ion beam (FIB)/scanning electron microscope (SEM) analytical system. 

The AFM is used for imaging, measuring and manipulating matter at the nanoscale. It uses a mechanical probe to measure the surface topography of a sample. The DualBeam is a FIB/SEM system that provides three dimensional (3D) imaging and analysis down to the nanoscale. The DualBeam uses an SEM to image FIB-milled cross sections, which reveal subsurface features.

Nanonics Imaging Ltd. provides combined near-field optical microscopes (commonly referred to as either NSOM or SNOM systems) and atomic force microscopes (AFM). More information can be found at: www.nanonics.co.il  

FEI (Nasdaq: FEIC) is a diversified scientific instruments company. It provides electron- and ion-beam microscopes and tools for nanoscale applications across many industries: industrial and academic materials research, life sciences, semiconductors, data storage, natural resources and more. More information can be found at: www.fei.com.

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