(September 24, 2010 – Marketwire) — DCG Systems has received ten orders for its recently patented LVx technology, introduced a few months ago. This rate of adoption and market share gain in the design debug and failure analysis market indicates significant demand for the LVx capabilities, which include continuous wave laser voltage probing (CW-LVP) and laser voltage imaging (LVI) through a combination of hardware and software.
DCG’s LVx technology can be added as an option to EmiScope, Meridian and Ruby systems. See a product round-up of semiconductor debug and test systems here. The first of a series of DCG patents on the LVx technology was recently awarded by the US Patent Office (US 7,733,100 B2).
LVI maps specific frequencies of operation to physical transistor locations and can be used to locate breaks in failing scan chains. LVI may also be used with laser voltage probing (LVP) to quickly determine the optimal locations for waveform acquisition.
CW-LVP provides fast functional waveform acquisition. The addition of this capability to the EmiScope complements the existing time resolved emission (TRE) capability. On the Meridian, CW-LVP provides the ability to acquire actual waveform data at photon or thermal emission locations.
The combination of LVI and CW-LVP enables accurate probing with high signal fidelity. LVI sucessfully maps the active transistors at specific frequencies, for example data and clock frequencies of a scan chain, and is being effectively for yield improvement by comparing good die to bad die.
DCG Systems, Inc. provides semiconductor electrical yield, debug and characterization solutions. For more information please visit http://www.dcgsystems.com.