(October 18, 2010) — Thermo Fisher Scientific Inc., part of Thermo Fisher Scientific Inc. (NYSE: TMO), launched a new version of the Thermo Scientific K-Alpha X-ray photoelectron spectrometer (XPS). This fully integrated surface characterization tool is designed for research and development of new surface chemistries as well as dealing with routine characterization of surfaces, thin films and coatings.
The original K-Alpha was designed to offer scientists and engineers a new XPS solution by offering unprecedented ease of operation, and a streamlined workflow via the Thermo Scientific Avantage data system. The latest revision of the K-Alpha platform features improved spectroscopic performance, delivering increased countrates, faster analysis times and improved chemical detection. Further enhancements include improvements to the unique sample viewing system, better automation, and a new glove box option for handling air-sensitive samples.
The new instrument integrates premier spectrometer performance with the latest version of the Thermo Scientific Avantage XPS acquisition and processing user interface. This combination of instrumentation and software combines high sample throughput with market leading analytical performance, essential for tackling the complex materials characterization needs of today’s surface analysis applications. The high level of integration between hardware and software enables users to calibrate their instrument with a single button press and incorporates full traceability of all system parameters.
The Avantage Data System is designed to offer exceptional levels of productivity via an optimized workflow that guides analysts through data acquisition, interpretation, processing and report generation. Avantage offers full digital tool control while providing a comprehensive range of XPS spectrum and image processing routines. Customized laboratory reporting templates allow analysis reports to be easily exported to standard PC applications, such as Microsoft® Office, at the click of a mouse. The new Avantage Indexer (AI) system allows quick and easy management of all stored data sets, allowing management by element, chemistry, acquisition date and other important parameters.
Thermo Scientific K-Alpha enables significant progress in the area of materials analysis. Improved performance and new software features in the upgraded instrument will enable progress in surface characterization,” said Mike Jost, vice president and general manager of molecular spectroscopy and surface analysis and microanalysis for Thermo Fisher Scientific.
The Thermo Scientific K-Alpha will be unveiled at booth 217 at the AVS 57 International Symposium and Exhibition 2010, October 17-22, Albuquerque, NM.
Thermo Scientific is part of Thermo Fisher Scientific Inc. (NYSE: TMO). For more information, visit www.thermofisher.com. For information on this product, visit www.thermoscientific.com/surfaceanalysis.
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