Teradyne grants SEMI license to Standard Test Data Format (STDF)

(November 2, 2010) — SEMI announced that Teradyne Inc. (NYSE:TER) has granted a worldwide royalty-free license of Standard Test Data Format (STDF), and any intellectual property rights, to SEMI to use, distribute, modify and support STDF. Under the supervision of SEMI International Standards, the license of STDF will ensure standards development and new products using STDF and future extensions will be unencumbered by IP ownership conflicts.

Advances in technology make it imperative to collect and diagnose detailed structural semiconductor test data during high-volume manufacturing to improve yield, test quality and overall test efficiency. However, multiple datalog formats and lack of industry standards prevent efficient use of test data across multiple test platforms and IC designs. This license represents an important milestone in the semiconductor test industry by enabling a more efficient, industry-wide application of STDF and future STDF extensions in the maintenance and development of test programs and other semiconductor test products. The demand for comprehensive datalog standards is greater than ever as IDMs, foundries, and outsourced test and assembly firms are looking to lower costs, improve test quality and speed implementation of test strategies across multiple test platforms and EDA vendors.

"This action will encourage increased participation in standards development activities from a broader section of the industry and enable broader adoption of STDF around the world," said Jonathan Davis, president of the Semiconductor Business Unit at SEMI. "This is an important milestone in industry collaboration for the semiconductor test industry. With Teradyne’s support, important and valuable international standards can now progress utilizing the well-regarded STDF solution."

The Collaborative Alliance for Semiconductor Test (CAST), a SEMI special interest group, formed a working group on SDTF in 2008 as a successor to a previously independent standards group. Through the group’s efforts, a new, standard extension for logging memory fails in STDF has been developed. The format is currently in ballot by SEMI International Standards for international adoption as an industry standard. The SEMI CAST working group on STDF, comprised of members from the ATE, EDA, OSAT and the IC industry, is currently evaluating continued development and enhancements of STDF.

"We are pleased to help enable this important milestone in the semiconductor test industry by designating SEMI as the primary body to oversee the enhancement and further adoption of STDF," said Greg Smith, Broadband and Computing Business Unit manager, of Teradyne. "SEMI and CAST working groups have a unique environment that allows all the participants in the Semiconductor Test ecosystem to further the efficiency of the entire manufacturing process. This action will better serve Teradyne, our customers and the entire semiconductor industry by allowing us to focus on innovation and customer service, and not unproductive duplication of effort."

Teradyne (NYSE:TER) supplies automatic test equipment used to test complex electronics used in the consumer electronics, automotive, computing, telecommunications, and aerospace and defense industries. For more information, visit www.teradyne.com.

SEMI is the global industry association serving the manufacturing supply chains for the microelectronic, display and photovoltaic industries. For more information, visit www.semi.org.

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