July 26, 2011 – BUSINESS WIRE — TESCAN introduced the LYRA GM focused ion beam and scanning electron microscope (FIB–SEM) workstation, calling the system a multifunctional tool for nanotechnology.

The tool integrates a FIB column and field-emission SEM with a range of nano-structuring, imaging, and nano-analytical tools, including a Time of Flight secondary ion mass spectrometer (TOF-SIMS) and in-situ Atomic Force Microscope (AFM). The design came out of work in the European FIBLYS project (http://www.fiblys.eu). Researchers can use the LYRA GM to characterize complex samples and solve analytical problems rapidly.

Multiple analytical techniques can be performed simultaneously from the same point of interest while milling through a sample with the FIB. Complementary information from several techniques can be combined for in-depth analysis of nano structures. The multiple-tools-in-one approach cuts down on sample exposure to contamination or oxidation, TESCAN says.

Chemical imaging with a resolution of about 50nm has been demonstrated.

TESCAN makes scientific instrumentation, such as Electron Microscopes and Focused Ion Beam workstations. Learn more at www.tescan.com