Verigy debuts scalable semiconductor testers, digital channel cards

July 8, 2011 – Marketwire — Verigy, an Advantest Group company (TSE: 6857) (NYSE: ATE), launched scalable, cost-efficient testers for advanced semiconductors, such as 3D device architectures and 28nm and below technology nodes: V93000 Smart Scale Generation. The test systems and pin cards will debut at SEMICON West 2011, July 12-14 at the Moscone Convention Center in San Francisco, CA.

Compatible with Verigy’s V93000 platform, the Smart Scale testers boast advanced per-pin capabilities. Each pin can run with its own clock domain, matching the exact data rate requirements of the device under test. With power supply modulation, jitter injection and protocol communication, system-like-stress tests can be carried out at the ATE level.

The Smart Scale tester classes — A, C, S and L — each have a different test head size, enabling Verigy to provide the most efficient solution for each user’s specific applications. Each class is compatible with the others, allowing devices to move from one test environment to another when production volumes change.

Along with its V93000 Smart Scale testers, Verigy also is launching three new digital channel cards:
The new Pin Scale 1600 digital card and Pin Scale 1600-ME (memory emulation) card offer data rates ranging from DC to 1.6 gigabits per second (Gbps) and double or quadruple the densities of previous pin cards. The small-form-factor cards incorporate Verigy’s clock-domain-per-pin, protocol-engine-per-pin, PRBS per pin and SmartLoop testing capabilities for symmetrical high-speed interfaces. In addition, they provide precision DC capabilities and can perform asynchronous testing for high multi-site efficiency and concurrent testing.

Verigy’s new Pin Scale 9G card aims for affordable at-speed test with data rates of up to 8 Gbps with the same per-pin versatility as the Pin Scale 1600. The Pin Scale 9G card supports bi-directional capabilities on all pins and single-ended and differential modes of operation. It also can perform both pattern- and pattern-less test to address the vast majority of testing needs, from parallel I/O testing for design verification to serial physical layer (PHY) testing in high-volume manufacturing.

Verigy will launch the products at SEMICON West booth #6575 in the North Hall of the Moscone Center, within the Advanced Technologies Manufacturing TechZONE section.

Verigy provides advanced semiconductor test systems and products. Additional information about Verigy, an Advantest Group company, can be found at Information about Advantest can be found at

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