August 22, 2011 – PRNewswire — National Instruments (Nasdaq: NATI) added per-pin parametric measurement unit modules and source measure unit modules to its PXI platform for semiconductor characterization and production test: NI PXIe-6556 200 MHz high-speed digital I/O with PPMU, the NI PXIe-4140 and NI PXIe-4141 four-channel SMUs.

PCI eXtensions for Instrumentation (PXI) is an open specification governed by the PXI Systems Alliance defining a rugged, CompactPCI-based platform optimized for test, measurement and control.

The NI PXIe-6556 high-speed digital I/O module generates and acquires a digital waveform at up to 200MHz or performs DC parametric measurements with 1% accuracy on the same pin. NI says the addition will simplify cabling, decrease test times and increase tester density. Timing skew is nearly eliminated by a built-in timing calibration feature. The NI PXIe-6556 comes with an option to switch in another NI SMU for higher precision, and engineers can initiate parametric measurements based on hardware or software triggers.

The NI PXIe-4140/41 SMU modules provide four SMU channels per PXI Express slot, up to 68 SMU channels per PXI chassis in 4U of rack height. The SMU modules offer sampling rates of up to 600,000 samples per second, targeting high-pin-count device test. The NI PXIe-4141 boasts SourceAdapt technology to custom tune the SMU output response to any given load, for stability with minimal transient times.

The modules are compatible with NI LabVIEW system design software.

National Instruments offers software and modular cost-effective hardware for measurement and test. Visit www.ni.com/lp/semiconductor to learn more.

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