August 1, 2011 – BUSINESS WIRE — SATS provider Unisem purchased a LTX-Credence PAx RF Test System for its Sunnyvale, CA, test development center. The system includes the full feature set LTX-Credence offers for development and production test of front-end RF semiconductor devices.

The PAx system is designed to meet high-volume manufacturing test needs of advanced front-end RF devices: Multiband RF power amplifiers, RF analog system in package (SiP), RF front-end modules, and RF discrete devices. The X-Series XRF test instrumentation enables performance tests under WLAN, GSM, WiMAX, Edge CDMA, LTE, Bluetooth, WCDMA, or other RF signaling standards.

"Higher levels of functionality, high unit volume growth and constant pricing pressures" are driving the RF sector, said John Shelley, product director, LTX-Credence, explaining the aims of the PAx tester.

Unisem’s goal is to build up its Sunnyvale test center to be the leader in its test equipment roadmap, added Marita Erickson, general manager, Unisem-Sunnyvale. In March, Unisem added an Accretech wafer prober for 12" wafers at Sunnyvale. Earlier this month, Unisem added a Teradyne J750Ex for consumer digital testing. Customers work with Unisem at Sunnyvale to optimize test programs and scale up test routines to volume for transfer to Asia.

LTX-Credence provides ATE products for semiconductor test in wireless, computing, automotive and entertainment market segments. Additional information can be found at www.ltxc.com.

Unisem is a global provider of semiconductor assembly and test services (SATS), offering wafer bumping, wafer probing, wafer grinding, a wide range of leadframe and substrate IC packaging, wafer level CSP and RF, analog, digital and mixed-signal test services. Learn more at www.unisemgroup.com.

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