Multitest vertical contact test probe technology eschews barrels

October 28, 2011 — Semiconductor test equipment maker Multitest debuted the Quad Tech concept, next-generation vertical contact technology with a barrel-less architecture.

The design has 4 continuously engaged internal contact points. Quad Tech features high current capabilities, high bandwidth and low inductance. A large mechanical compliance window accommodates stack height tolerances.

Probe life and cleaning intervals are improved by the design, which enables excellent plating, Multitest reports.

Currently, Multitest offers Mercury, Gemini, and Gemini Kelvin probes based on Quad Tech.

Multitest is a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide. For more information about Multitest

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