LED inspection unit launches Altatech Semiconductor’s LEDs line

December 14, 2011 — Altatech Semiconductor S.A. launched its first LED inspection system, the non-contact AltaSight LEDMax, for detecting, classifying and characterizing defects on wafers used in manufacturing light emitting diodes (LEDs).

Also read: Fraunhofer IZM’s packaging center installs Altatech CVD

AltaSight LEDMax is designed to detect process-induced defects (PIDs) from metal-organic chemical vapor deposition (MOCVD) of epitaxial layers, patterning processes, and final inspection. A proprietary sensor technology filters out all background noise. Surface imperfections can be imaged with 1


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