January 26, 2012 – BUSINESS WIRE — Test system maker Keithley Instruments Inc. upgraded the capabilities of its Automated Characterization Suite (ACS) Test Environment to ACS Version 4.4. The software is used with several Keithley instrument and system configurations for automated device characterization and reliability analysis.
V.4.4 supports a newly enhanced reliability test option (Model ACS-2600-RTM), as well as expanded ultra-fast bias temperature instability (BTI) testing capabilities; high current testing of power components; and new project libraries designed for high voltage reliability, charge pumping, pulse-stress reliability, and stress migration testing applications. The revision adds support for Windows 7 operating systems.
ACS combines multiple instruments used for semiconductor device characterization and parametric measurements into a unified test environment optimized for flexibility, speed, and productivity in testing and analysis.
The Model ACS-2600-RTM reliability test module simplifies creation and execution of complex stress-measure-analyze test sequences used in device reliability tests, such as HCI, TDDB, NBTI, J-Ramp, and more. Semiconductor test engineers use it for device reliability testing and analysis in R&D and production test environments. The module can be applied in characterizing single devices or managing high-device-count test applications. It quickly defines test parameters common to large groups of devices or many sub-groups, executes tests with run-time results feedback, and enables earlier analysis of large datasets of measurement results.
In order to respond to the high-speed behaviors associated with semiconductor device failure mechanisms and produce the masses of data associated with reliability testing of multiple devices in parallel, each source measurement unit (SMU) instrument in a test configuration must be fast, and all SMU channels must work quickly as a group or several sub-groups. For reliability test applications of this type, the Model ACS-2600-RTM maximizes the performance of Keithley