The IEEE International Reliability Physics Symposium (IRPS) is set for April 15, 2012 – April 19, 2012, in Anaheim, CA. The IRPS is celebrating 50 years of ground-breaking semiconductor physics of failure research. Covering advanced materials, 3D integration, product reliability, transistors and circuits, silicon/packaging interactions, MEMS, GaN, and photovoltaics, the technical program promises to bring attendees the latest in semiconductor reliability concerns. For more information and to register online, browse to http://www.irps.org.