Camtek ships semiconductor inspection tools to leading US IDM

May 7, 2012 — A leading, US-based integrated device manufacturer (IDM) ordered about $5 million of front- and back-end semiconductor automatic optical inspection (AOI) tools from Camtek Ltd. (NASDAQ and TASE: CAMT).

The multiple systems will be installed for various production applications in semiconductor fab and packaging, as early as Q2 2012.

The order “strengthens Camtek’s partnership with the world-leading IDM,” commented Roy Porat, Camtek CEO.

Camtek’s semiconductor AOI tools fall under the Falcon and Gannet lines. Falcon tools can be used post-wafer-dice, post-bump, and around electrical test, among other production steps. Gannet is a submicron macro metrology and inspection tool that inspects all wafers in all lots, at high throughput. Camtek also makes a range of inspection tools for IC substrates and printed circuit boards (PCBs). Learn more at


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