SEMICON West '00—July 10, 2000—In San Francisco, Calif. today, August Technology introduced two high-speed wafer inspection systems for defects down to 0.5 µm.
By pennNET Staff
SEMICON West '00—July 10, 2000—In San Francisco, Calif. today, August Technology introduced two high-speed wafer inspection systems for defects down to 0.5 µm.
By pennNET Staff
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