REHOVOTH, Israel—Aug. 29, 2000—In an effort to improve its wafer manufacturing efficiency, Motorola has placed multiple orders for Nova Measuring Instrument's NovaScan Integrated Thickness Monitoring (ITM) systems.
By pennNET Staff
REHOVOTH, Israel—Aug. 29, 2000—In an effort to improve its wafer manufacturing efficiency, Motorola has placed multiple orders for Nova Measuring Instrument's NovaScan Integrated Thickness Monitoring (ITM) systems.
By pennNET Staff
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