Wafer analysis system is “point and shoot” Nanotronics technology

May 13, 2011 – MMD Newswire — Nanotronics Imaging LLC, is introducing the nSPEC semiconductor analysis system at the CS Mantech show in Palm Springs, CA. The product’s proprietary software and hardware enable rapid and detailed analysis of wafer defects. Complete system automation with cassette-to-cassette loading of 2-8" wafers is available.

Nanotronics promotes "Point and Shoot" microscopy, as it aims to eliminate a learning curve for users, while giving accurate and easy to interpret data.

For more on Nanotronics Imaging, visit www.nanotronicsimaging.com

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