Anritsu plans on-wafer high-frequency test demo at IMS

June 15, 2012 — Anritsu Company will demonstrate its broadband Vector Network Analyzer (VNA) system, which conducts single sweeps from 70kHz to 140GHz during wafer probe test, in its booth 807 at the International Microwave Symposium (IMS), June 19-21 in Montreal.

The demonstration will showcase Anritsu

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