Multitest wafer level test contactors approved by fabless customer for Asia testing

March 10, 2011 — Multitest, designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announced that a major fabless semiconductor manufacturer has evaluated and approved its Mercury-based wafer-level contactors for subcontractors in Asia.

Click to EnlargeMercury contactors have eight sites and over 25 spring probes per site. The contactors passed all qualification tests in the US and have now been deployed to multiple testing subcontractors in Taiwan and Singapore. Based on this successful evaluation, the manufacturer has awarded Multitest with two additional wafer-level chipscale package (WLCSP) projects. Several of the Asian subcontractors have experience with the Mercury technology and cite its long life, low maintenance requirements, and low replacement probe price.

Mercury probes have a bandwidth of approximately 20GHz, current-carrying capacity of over 2Amps, inductance of approximately 1nH, and life of over one million insertions at wafer level (values are pitch dependent).

For more information about Multitest’s Mercury-based wafer-level contactors, visit www.multitest.com.

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