Probe Card for Flip Chip / Bumped Logic Devices

Megamax, the latest addition to Wentworth Laboratories, Inc.’s vertical probe card line addresses major probe card challenges encountered when probing high power flip chip devices such as microprocessor units (MPU’s), graphics processing units (GPU’s) and System on Chip (SoC’s). Built on Wentworth’s proprietary, chemically etched and photo defined contact technology that is scalable to specific probe requirements, Megamax contacts are designed to carry 1.2 amps of continuous current while at the same time delivering a solution for tight pitch applications down to 170 &#181m. This capability reportedly all but eliminates the burning of contacts and significantly increases uptime.

Unique to the Megamax is its site maintainability, as customers can remove and insert replacement contacts without disassembly, This feature is said to improve test cell utilization and lowers the cost of ownership. High pin counts are accommodated in single, dual, or quad die solutions exceeding 16,000 contacts. Wentworth Laboratories, Inc. Brookfield, CT. www.wentworthlabs.com

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