San Jose is a city that respects and, more importantly, loves technology and electronics. This was evident from the moment I stepped off the plane, with “San Jose Welcomes IMAPS 2007” signs along the baggage claim and taxi bays. Cordial letters from the mayor and governor welcomed IMAPS attendees as well. Restaurants in the vicinity of the show posted “Welcome IMAPS!” signs in their windows. The Tech Museum of Innovation was bustling with people of all ages. In this tech-friendly atmosphere, surrounded by silicon wafers inside and outside the IMAPS show, I was in the right mood to study harsh-environment medical electronics during the “Biomedical Materials, Devices, and Packaging” session.

The FOX-15 full-wafer contact test and burn-in system, the fourth and latest member of the FOX family of full wafer contact systems, is focused on parallel testing and burning-in up to 15 wafers at a time. As with all members of the FOX product family, the FOX-15 contacts every die on each wafer simultaneously. The FOX-15 system is designed for use with wafers that require test and burn-in times typically measured in hours. The system has: 15 wafer slots, wafer sizes from 2-in. (50.8mm) up to 300mm, parallel test and burn-in of thousands of die/wafer, and individual die power channels to isolate shorted dies. Aehr Test Systems, Fremont, California, www.aehr.com.