FEI sells tool to BASF

Mar. 10, 2006 – FEI Co. of Hillsboro, Ore., announced that BASF has ordered one of its top-of-the-line DualBeam systems, the Strata 400. The system features a focused ion beam for nanoscale milling and deposition, and a scanning electron microscope for ultra-high resolution imaging below 100nm.

The Strata will be utilized in BASF laboratories, along with previously installed FEI Tecnai transmission electron microscopes for a wide range of R&D projects. These projects include, among others, the study and establishment of processes for the reliable detection, monitoring and characterization of nanoparticles as part of the European Union’s NanoSafe research project, the development of nanostructured coatings aimed at preventing algae and mollusks from colonizing on ship hulls, and the development of products that can reduce the emission of CO2 gases from power generating stations.

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