Veeco unveils new scanning probe scopes

Mar. 28, 2006 – Veeco Instruments Inc. (Nasdaq: VECO), a supplier of instrumentation to the research and nanoscience community, announced the launch of two new scanning probe microscope (SPM) products, the MultiMode V SPM and the Dimension V SPM for both research and industrial applications.

Both products feature Veeco’s next generation controller, the Nanoscope V, which is intended to allow researchers to see faster molecular scale events and capture more information in an image.

In addition, Veeco’s new Easy-AFM software offers a graphic interface for new or infrequent SPM users. The company expects greater simplicity will lead to broader adoption of the tools.

The MultiMode V is designed to enable measurements of small samples, such as polymers and electrochemical materials, while the Dimension V is primarily used for larger samples such as semiconductor wafers, data storage films and electrical characterization applications.

Both products feature high-speed data capture (50MHz), increased thermal tune capabilities and high pixel density images which allow observation of large structures and small features in the same image. The Nanoscope V controller captures up to eight images simultaneously.

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