Ambios introduces Q-View White Light Interferometer

October 23, 2008 Ambios Technology, Inc. introduced its new Q-View White Light Interferometer/SPM system at the 23rd Annual Meeting of the American Society for Precision Engineering in Portland, OR. This new system combines the capability of white light interferometry and SPM technology.

The Q-View Interferometric Module integrates seamlessly onto the Q-Scope SPM platform. Q-View uses optical profiler technology to render and measure a large area (500μm) in a few seconds. Switch to SPM mode and characterize surface structures at the sub-angstrom level.

“The synergy of combining SPM and Interferometer technology on a single platform will greatly enhance surface imaging and metrology for the community of SPM users,” said Rick Olds, sales and marketing manager of Ambios Technology.

Q-View White Light Interferometer/SPM is provided as a fully integrated system with the benefits of two technologies on one unified platform. In addition, the Q-View Interferometer module is available as an upgrade for existing Q-Scope customers.


Q-View Atomic Force Microscope (AFM/SPM) with Interferometer.

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