June 13, 2008 — Novelx calls its mySEM “the only high-performance, compact, field-emission scanning electron microscope.” And, the company says, it delivers capabilities available only in high-end field emission SEMs, at a fraction of the cost.

Powered by the patented Novelx Stacked Silicon technology, the mySEM is a research-grade SEM for imaging and characterizing nanoscale objects and materials. According to the company, the unit is compact enough to install easily where other tools won’t fit

Optimized for low-voltage operation and without need to coat non-conductive samples, mySEM is suitable for non-destructive imaging of energy sensitive samples, biomaterials and thin films. It promises to speed research and product development cycles by decreasing the time from experimentation to characterization.

mySEM promises research grade performance:
– Sub-10nm resolution at variable low-voltages
– Thermal field emission electron source provides high
signal-to-noise ratio and consistent long-lasting performance
Versatile Detector
– Selects secondary electrons for topographical detail
– Collects backscatter electrons for enhanced material contrast
Low-Voltage Imaging
– Image energy sensitive materials such as thin films,
membranes and biomaterials with high surface contrast
– No need to coat non-conductive samples and obscure surface
features
– Compact instrument fits your available lab space
– Simple installation doesn’t require dedicated facilities

In addition, the unit boasts these specs:
– Resolution: <10 nm at 1.0 kV
– Magnification: 250 to 65,000x
– Scan Field: 1 x 1 mm (max)
– Beam Voltage: 0.5 to 2 kV
– Beam Current: 0.2 to 2 nA
– Electron Source: Thermal Field Emmision
– Detector: SE and BSE
– External Detector: 1 port
– Multichannel Detection: 4-Quadrant