Gannen-XM provides “true” measurement of MEMS, micro objects


The XM is optimized for true 3D measurements. (Photo: Xpress)

January 17, 2008 – Following the introduction of the Gannen-XP, a tool designed to enable ultra precision 3D measurements, Netherlands-based Xpress Precision Engineering BV has released the Gannen-XM. The XM is optimized for true 3D measurements on micro components and MEMS.

“We see a rising demand for 3D measurements on micro components and MEMS”, says Ir. Bos, Director of Technology for Xpress Precision Engineering BV. “Lower stiffness, lower replacement costs and smaller tips make the Gannen-XM ideal for these kinds of measurements.”

The Gannen-XM is fully compatible with the mounting of the Gannen-XP. To minimize preparation down-time, a dual setup is recommended. Probing forces with the Gannen-XM are in the micro-Newton range and the probing system can be delivered with probing tips down to 50 micrometers.

“In the field of micro components and MEMS, measurements for quality control and further research need to meet the highest standards,” says Ir. Bos. “We are determined to help our customers achieve these standards.”

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