Category Archives: Packaging and Testing

July 20, 2012 — Aerotech’s Sensor Fusion is a 3U data acquisition device integrated with the company’s Automation 3200 (A3200) motion controller to provide precise time alignment of motion and data acquisition functions. Integrating the data acquisition into the motion control platform keeps costs lower, with quick and easy configuration and setup for shorter development time, according to Aerotech.

Also read: You make MEMS. Should you make sensor fusion software?

Sensor Fusion accepts up to four SF cards. Data collection is synchronized across all cards so there is never a need to align data after collection. Data collection, configuration, and analysis are done using the A3200’s extensive set of software tools, so there is no additional software required.

SF cards are available for digital input and output, analog input and output, encoder input, and PSO output. Each card can be used in the Sensor Fusion, in any configuration. Both high-power digital output cards and high-resolution analog output cards are offered. With no parameters to manage and no difficult setup to go through, switching cards from one system to another is easy. Breakout blocks make accessing each of the inputs and outputs simple, while the use of standard D-connectors on each card allows users to make their cables from common parts.

Setup, data recording, and data playback can be done through .NET, C, LabVIEW, MATLAB, or Aerotech’s own AeroBasic programming language. All inputs and outputs can be managed graphically through our I/O Manager utility that is part of the Motion Composer in the A3200 software suite. By managing data acquisition directly from the same library or interface used to program motion control, there is less time spent managing separate environments. Once data is collected it can be graphed in the Digital Scope or exported to other data manipulation packages. Sensor Fusion connects to the A3200 Motion Network via Firewire and can be run with or without any A3200 motion control devices.

Sensor Fusion has all of the position synchronized output (PSO) functionality from our standard motion controller product lines. Single, double, and triple PSO are available. Coupling data playback with Aerotech’s traditional PSO functionality allows users to control up to 96 digital outputs or 48 analog outputs for precision control of multiple devices from one positioning system.

Sensor Fusion is available in three different mounting configurations – desktop, rack mount and panel mount. The desktop version is standard and comes with integrated side handles and non-skid feet. The rack-mount version is designed for any standard 3U rack. Both the rack- and panel-mount relocate the power input to the proper side of the machine for the configuration. These flexible configurations allow you to easily move Sensor Fusion from one system to the next or fix permanently in a console or system weldment.

Learn more at www.aerotech.com.

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July 20, 2012 — Micro electro mechanical systems (MEMS) must be characterized during device development. Polytec asserts that advanced optical measurement techniques are necessary for characterization, as electrical tests can check functionality, but not all physical properties.

Polytec has released a white paper on the topic: “Optical Measurement Techniques for Dynamic Characterization of MEMS Devices.” It details the state-of-the-art optical measurement capabilities available for full field dynamic response and surface topography measurements of MEMS devices.

One capability that Polytec offers, laser Doppler vibrometry, enables real-time dynamic response measurements with resolution down to the picometer level and frequency bandwidth to 24MHz. The white paper details characterization studies that exemplify use of this technology for micro mirror array, pressure sensor, cantilever beam and accelerometer MEMS designs.
Download the full paper at: http://www.polytec.com/int/applications/micro-nano-technology/

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July 18, 2012 — Purdue University researchers have demonstrated self-calibrating micro electro mechanical systems (MEMS), which enable higher accuracy for existing and new MEMS applications.

“Each MEMS device is slightly different due to variations that occur in manufacturing,” said Jason Vaughn Clark, an assistant professor of electrical and computer engineering and mechanical engineering at Purdue University, explaining the value of self calibration. Microstructure geometry, stiffness, and mass all influence performance, and can vary MEMS device to MEMS device. Conventional MEMS test methods are impractical and expensive, with unknown accuracy and large uncertainty, Clark added.

Clark developed the self-calibration theory, then demonstrated the device alongside doctoral student Fengyuan Li, validating the thesis.

Figure. A self-calibratable MEMS. SOURCE: Purdue University Birck Nanotechnology Center image/Jason Vaughn Clark.

The self-calibrating technology makes it possible to accurately measure displacement on a scale of micrometers to less than a nanometer. “Quantities like velocity, acceleration, force, stiffness, frequency, and mass can be related to displacement,” said Clark.

The heart of the self-calibrating MEMS are two gaps of differing size, electrostatic sensors and comb drives with meshing fingers drawn toward each other when a voltage is applied, and returned to their original position when the voltage is turned off. The comb drives measure the change in capacitance while gauging the distances of the two gaps built into the device. The fine measurements reveal the difference between the device’s designed layout and the actual dimensions.

"Once you learn the difference between layout and fabrication, you have calibrated the device," Clark said. "Many MEMS designs with comb drives can be easily modified to implement our technology."

The new self-calibratable MEMS could eliminate or reduce the need for rigorous factory calibration on high-accuracy MEMS for navigation or other applications,  Clark said, estimating up to 30% of manufacturing costs relate to calibration.

The self-calibratable MEMS could lead to high-performance data storage technologies and advanced lithography to create next generation computer circuits and nanodevices. “A $15 chip that can fit on your fingertip…is able to measure MEMS displacements better than a $500,000 electron microscope,” as a result of self-calibration, Clark noted.

Researchers will use the new self-calibration approach to improve the accuracy of atomic force microscopes (AFMs), calibrating AFM displacement, stiffness, and force.

The group also will use a calibrated MEMS to measure the difference in gravity between different heights above the ground. The ability to measure gravity with such sensitivity could be used as a new tool for detecting underground petroleum deposits. "Conventional gravity meters can cost over $200,000," Clark said. "They consist of a large vacuum tube and a mirrored mass. Gravitational acceleration is determined by measuring the drop time of the mass in free fall. Since oil or mineral deposits have a different density than surrounding material, the local gravity is slightly different." Other applications abound.

The self-calibratable technology also could allow MEMS to recalibrate themselves after being exposed to harsh temperature changes or remaining dormant for long periods.

The work is based at the Birck Nanotechnology Center in Purdue’s Discovery Park. The research is funded by the National Science Foundation.

Findings are detailed in a paper to appear later this year in the IEEE Journal of Microelectromechanical Systems (JMEMS), “Self-Calibration for MEMS with Comb Drives: Measurement of Gap,” Fengyuan Li and Jason Vaughn Clark, Purdue University, Discovery Park, Birck Nanotechnology Center.

Abstract:

We present a practical method for measuring planar gaps of MEMS with comb drives by on-chip or off-chip electrical probing. We show that our method is practical, accurate, precise, and repeatable. The option of on-chip, postpackaged electrical measurement enables MEMS to be autonomously self-calibratable. We use the measurement of gap to determine the geometrical difference between layout and fabrication, which can lead to measurements of other properties such as displacement, force, stiffness, mass, etc. Our method consists of applying enough voltage to close two unequal gaps and measuring the resulting changes in capacitances. Many MEMS designs with comb drives can be easily modified to implement our technology. Our results are an order better than convention, and suggest means for further improvement.

Courtesy of Emil Venere and Jason Vaughn Clark at Purdue.

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July 17, 2012 – BUSINESS WIRE — Spirent Communications, which develops ways to test positioning, navigation and communications technologies, launched its new SimSENSOR sensor simulation software for micro electro mechanical systems (MEMS). The software enables R&D technicians to test sensor fusion algorithms in navigation systems that include MEMS inertial sensors and multi-GNSS.

The product supports test on algorithms with inputs from various sensors, including accelerometers, gyroscope, magnetometer, digital compass and barometric height sensors. SimSENSOR works in tandem with Spirent’s multi-GNSS constellation simulators by simulating MEMS sensor outputs on a common trajectory with the simulated GNSS signals. Trajectories made by representative human motion gestures, such as arm movements, are included with SimSENSOR. Representative MEMS noise models and errors such as bias and drift are also included and are available under user control.

Sensor fusion is increasingly used to enable new applications, such as indoor positioning, said Rahul Gupta, product manager with Spirent’s Positioning Technology business. SimSENSOR enables accelerated, lab-based R&D for sensor fusion development. Sensor fusion and device test was one of the topics of concern in the International Technology Roadmap for Semiconductors (ITRS) 2012 update at SEMICON West last week.

Spirent has extensive experience of test systems for blended GPS-inertial technology. In 2007, Spirent launched SimINERTIAL to test inertial navigation systems involving high grade GPS/inertial units suitable for military applications. SimSENSOR benefits from the experience gained by Spirent, in particular in relation to ensuring coherency and stability between GNSS and simulated sensor output streams.

Spirent Communications plc. (LSE:SPT) is a global leader in test & measurement used to test data centers, cloud computing and virtualized environments, high speed Ethernet networks and services, 3G/4G wireless networks and devices, network and application security, and positioning technologies. For more information, visit http://www.spirent.com.

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July 13, 2012 — At SEMICON West 2012, this week in San Francisco, CA, the working groups of the International Technology Roadmap for Semiconductors (ITRS) held 3 sessions (TechXPOTs) outlining 2012 updates to the roadmap. Check out the updates to the front-end, scaling roadmap working groups here.

The ITRS undergoes major revisions on odd-numbered years. 2012 being an even-numbered year, very little change occurred to the Overall Roadmap Technology Characteristics (ORTC). However, within the working groups, some updates were worth noting.

Also read: 2011 ITRS: DRAM, 3D Flash, MEMS, nano-scaling steal the show

First, the changes to the ORTC, presented at the TechXPOT by Bob Doering. Of interest were changes focused directly or indirectly on 450mm. ITRS has moved the forecast production start date to 2015-2016. The definition of

July 13, 2012 — SEMICON West, this week in San Francisco, CA, hosted 3 TechXPOT sessions on the International Technology Roadmap for Semiconductors (ITRS, http://www.itrs.net/) 2012 update. At the back-end technologies session, roadmapping for More than Moore was addressed as both a philosophical and technical matter.

Also read: 2011 ITRS: DRAM, 3D Flash, MEMS, nano-scaling steal the show

Introducing the back-end-focused working group presentations, Bob Doering, representing the Overall Roadmap Technology Characteristics (ORTC), said that the Roadmap is not just about scaling anymore. Patrick Cogez, presenting More than Moore, picked up this thread, saying that the long-time focus on semiconductor scaling now has a partner, diversification, in More than Moore process technologies. More than Moore — encompassing advanced wafer-level and 3D packaging, micro electro mechanical systems (MEMS), and related microelectronics technologies — are harder to roadmap than CMOS technologies. Scaling semiconductor nodes has always offered the combined benefits of faster, cheaper, smaller, lower-power chips (Moore

July 10, 2012 — InvenSense, Inc. (NYSE:INVN), MEMS-based sensor maker, introduced its second-generation MPU-6500 6-axis MotionTracking device for smartphones, tablets, wearable sensors, and other consumer markets.

The MPU-6500’s 3 x 3 x 0.9mm QFN package is the world’s smallest for a 6-axis MotionTracking device, according to InvenSense. The single-chip design combines a micro electro mechanical system (MEMS) 3-axis gyroscope and 3-axis accelerometer with an onboard Digital Motion Processor (DMP). The MPU-6500 MotionTracking device offers nearly 60% lower power (1.8V operation) and a 45% smaller package than conventional designs. It consumes 6.1mW of power in full operating mode. Gyroscope performance is ±5dps zero-rate-output and 0.01dps/√Hz of noise; accelerometer specifications include a typical offset of ±60mg, 250µg/√Hz of noise, and 18µA of current in low-power mode.

The combo sensor enables pedestrian navigation, context-aware advertising, and other location-based services, along with supporting the specifications for emerging wearable sensor applications such as remote health monitoring, sports and fitness tracking, and other consumer applications. The MPU-6500 software drivers are fully compliant with Google’s latest Android 4.1 Jelly Bean release, and support new low-power DMP capabilities that offload the host processor to reduce power consumption and simplify application development.

Turnkey combo sensors can accelerate time to market and simplify design/software programming of devices, as well as inherent size and power reductions, simplified product qualification and inventory management, and precise sensor alignment and calibration. Learn more about sensor fusion in You make MEMS. Should you make sensor fusion software?

The MPU-6500 is sampling now to selected customers with mass production slated for Q4 2012.

InvenSense Inc. (NYSE:INVN) provides MEMS-based motion sensors for consumer electronic devices. More information can be found at www.invensense.com.

Check out Solid State Technology’s coverage of SEMICON West 2012!

July 2, 2012 – BUSINESS WIRE — Tessera Technologies Inc. (NASDAQ:TSRA) has received notice from Powertech Technology Inc. (PTI) that it will terminate its license agreement with the semiconductor packaging and optics technology company. Tessera also completed phase 1 of its acquisition of camera module technologies from Flextronics.

Tessera Inc., a wholly-owned subsidiary of Tessera Technologies Inc., received a letter from Powertech Technology Inc. (PTI) that purports to terminate its license agreement with Tessera Inc. PTI stated that on July 30, 2012, it will make a payment to Tessera Inc. in protest under the license agreement for the quarter ended June 30, 2012.

PTI filed a complaint against Tessera, Inc. in December of 2011, seeking a declaratory judgment that PTI had the right to terminate its license agreement due to a breach of contract by Tessera, Inc.

June 28, 2012 — An annual guide for navigating the micro electro mechanical systems (MEMS) events at SEMICON West, July 10-12 at Moscone Center in San Francisco, CA.

To get a sense of the scope of MEMS developments and trends, read Paula Doe’s preview articles, MEMS manufacturing changes with HV consumer apps and Maturing MEMS sector looks at ways to work together

TUESDAY, July 10, 10:30am-3:30pm

Taking MEMS to the Next Level: Transitioning to a Profitable High-Volume Business

Presented in cooperation with MEMS Industry Group (MIG)

We’ve expanded the MEMS program to all day this year, and invited speakers from around the world to address practical potential solutions to the major manufacturing issues for growing the sector to the next level. Yole Développement’s J.C. Eloy will give his views on the future of the industry and what it will take to get there. Harmeet Bhugra will talk about IC maker IDT’s entry into the MEMS timing business. Doug Sparks from the new Chinese MEMS IDM Hanking Electronics talks about the opportunities in the China market. Foundry executives Donald Robert from Teledyne Dalsa and Peter Hrudey from Micralyne examine possible collaborative solutions to speed time-to-market. Hillcrest Labs CTO Charles Gritton talks about issues of software integration and sensor fusion.

On the manufacturing technology side, Coventor’s Matt Kamon tells us what’s coming next in MEMS design automation software, Applied Materials’ Mike Rosa talks about next-generation DRIE and other new processes being developed specifically for MEMS production, ‘and Nikon’s Jumpei Fukui discusses the advantages of mini-steppers. In addition, Finnish startup ScanNano’s CEO Andrei Pavlov presents his work making low-cost cavities without etching and NIST’s Janet Cassard introduces standard reference materials and best practices for consistent characterization and troubleshooting of processes for calibrating instruments and communicating between customers and suppliers.

Location: Extreme Electronics TechXPOT at Moscone Center (South Hall). The stage is in the same place as last year, in the far back right-hand corner of the Moscone South exhibit hall.

 

WEDNESDAY July 11, 5:00-7:00pm

MIG Happy Hour

Save the date and time. MIG will host its annual Happy Hour at SEMICON West. Invitations will be sent soon.

THURSDAY, July 12, 10:30am-12:30pm

MEMS and Sensor Packaging

The SEMI Packaging Committee presents a program focusing on MEMS packaging technology issues, featuring Analog Devices’ Asif Chowdhury on issues of packaging MEMS for industrial applications, and Yole Développement’s Jerome Baron on the roadmap for MEMS packaging going forward. Florian Solzbacher from the University of Utah’s Utah Nanofabrication Laboratory presents on biomedical packaging issues, while Marc Bachman from the University of California talks about the future of MEMS manufacturing.

Location: TechXPOT North, Moscone Center (North Hall)

THURSDAY, July 12, 11:45-1:00pm

Flexible Batteries and Flexible Mounting of Thinned Silicon Die on Textiles, Skin Patches and Implants

MEMS folks interested in integrating sensors into innovative wearable, flexible, implantable applications may want to check out presentations in the Plastic Electronics program on patterning flexible batteries on unconventional substrates and embedding thinned conventional silicon die into flexible polymer packaging, from companies who don’t typically show up at MEMS events. Imprint Energy talks about its low-cost, high-energy density Zn polymer battery technology suitable for wireless and wearable sensors, Applied Materials presents its lower cost technology for making thin film batteries, and MC10 describes its conformal electronics packaging targeted at wearable and implantable sensors.

Location: Extreme Electronics TechXPOT, Moscone Center (South Hall)

For more information on SEMICON West 2012, please visit www.semiconwest.org. To register, click Register now.

The high-volume consumer applications driving the fast growth of the micro electro mechanical system (MEMS) market are putting new demands on MEMS development and manufacturing. Goals? Get products to market faster, make them easier to integrate into systems, reduce die size; and better control processes to bring down costs. That’s attracted investment from the supply chain in a range of new solutions, from innovative new process technologies and tools developed specifically for MEMS sector needs, to more efficient integrated design software.

June 27, 2012 — The MEMS sector is poised for a multiyear period of steady double digit growth, with 20% average annual increases in unit demand, as systems makers find ever more uses for low cost, easy-to-integrate silicon sensors and actuators, reports Jean Christophe Eloy, founder and CEO of Yole Développement, driving the MEMS market to double, to reach $21 billion by 2017. Volume consumer markets are driving much of this growth, as consumer applications accounted for more than 50% of total MEMS industry revenue in 2011. And that’s turning the once artisanal niche into a high volume production business, and bringing rapid technology change, with a push for speeding time to market, sharply scaling down die size, increasing integration of multiple sensors into combination units, and bringing more packaging value to the wafer level. “2011 has been the year of the transition of the MEMS market into big business with wide diffusion,” says Eloy. “But the ability of MEMS manufacturers to continue to scale size and cost, and to simplify development and system integration will directly impact the growth of MEMS business.”

Figure. Common model of an accelerometer being used as a block in the control system design stage. A common model reduces design iterations by allowing teams to easily move between design stages to identify failures and optimize the system. SOURCE: Coventor.

 

Meeting time-to-market needs with more efficient design tools
While decreasing time to market and cost reduction have always been key drivers, the short product cycle times associated with mobile consumer devices have forever changed the industry. “Development time is now measured in months, not years,” notes Mattan Kamon, Coventor’s Principal Technologist. “However, design is still mostly done using traditional research approaches, where different models are used at different stages of the design, costing valuable time.” Coventor’s approach accelerates MEMS product development by using a common model for all stages of design. An engineering team can use a single model to develop and optimize the MEMS device concept, tune and validate the design using 3D simulations, perform system simulation together with the ASIC, investigate packaging effects, and optimize yield. All of these steps can be performed using a single model, enabling MEMS teams to easily move back and forth between the design stages, identify failure mechanisms, and optimize the system.

Kamon argues this methodology has the accuracy to address integration effects and can optimize the nominal behavior and the range of behavior across a wafer due to fabrication variations. Coventor’s approach couples a library of high-order finite element models specialized for MEMS with judicious use of low-order finite element simulations, and uses the same simulators, namely MATLAB, Simulink, and Cadence Virtuoso, that are most widely used for analog/mixed-signal design. This holds potential for a MEMS verification flow that closely parallels the verification flow for analog/mixed signal design, and paves the way for a fabless MEMS industry complete with MEMS design kits (MDKs).

New processes to make low-cost cavities without etching

Finnish startup Scannano proposes that MEMS die size and cost could be significantly reduced, and performance improved, by creating sealed cavities in devices by using a controlled diffusion process, instead of by the traditional method of etching sacrificial layers and bonding on a cap wafer.

Following on from research with Nokia’s Research Center and Cambridge’s Cavendish Laboratory, company founders Andrei Pavlov and Yelena Pavlova came up with the idea of shrinking away buried layers in a device by through diffusion to create a vacuum gap, allowing the use of standard CMOS materials and equipment. The process deposits a proprietary multi-layer diffusion material, builds the MEMS structure over it, and then submits it to a series of processing steps to shrink the diffusion material. This creates a very accurate sealed vacuum cavity of the desired dimensions and configuration. “The gaps can be from a few nanometers to up to a micron deep, and can be vertical or at an angle, or multiple gaps could surround a structure, opening up the possibility of new types of MEMS designs,” says Pavlov. He also claims that shrinking features to 50-100nm can also reduce operating voltage to only a few volts and reduce heat, while the very smooth surfaces help to improve sensitivity, signal-to-noise ratio and performance.

The first application for Scannano’s Deep Vacuum Gap Technology is a tunable capacitor and switch for multiband tunability for mobile phones, under development with STMicroelectronics and tentatively targeted for initial trial production on a CMOS line by the end of the year. The new device adjusts operating frequencies by changing capacitance through moving membrane-like MEMS structures, created by adjusting gap dimensions above and below the membrane. Pavlov says work with ST has been progressing for about a year, and is now moving towards final device design and testing. Scannano is also working with other European CMOS device manufacturers to develop sensors for the automotive market, monolithically integrated with the ASIC in their CMOS fabs.

Figure. MEMS structures with aspect ratios of >100:1. SOURCE: Applied Materials.

Volume markets attract investment in dedicated MEMS processes and tools

Fast growing MEMS volumes have also attracted the attention of more semiconductor players, including equipment giant Applied Materials. Applied has invested aggressively in development of new film and process technologies to support current and future generations of MEMS production at ≤200mm wafer sizes, focusing on shrinking die size, improving throughput, and integrating MEMS processes into CMOS fabs, says Mike Rosa, MEMS product line manager. This includes DRIE technology critical for both increased productivity and process flexibility as next generation MEMS devices enter the sub-micron range of critical dimensions, with aspect ratios of >100:1 (see the figure above).

Applied Materials is also working on modifying its PVD and CVD equipment to make a variety of enabling films of new materials for MEMS, including thick (>20µm), low temperature CVD films (SiO2, SiGe, etc.); and PVD films such as magnetically aligned NiFe, high uniformity AlN and thick Al.

Tool vendors will need to be increasingly attuned to the MEMS device capability and technology requirements of their customers’ customers, the fabless device designers and systems companies, notes Rosa. “In the MEMS industry there is no traditional roadmap, like the ITRS, to define the future,” he says. “It will take a much more collaborative effort by all parties — tool vendors, device manufacturers, and end-market product developers — to define and deliver the next generation MEMS designs that are destined for the newest ‘next big thing’ products.”

Also focusing on enabling tools for next generation MEMS is Nikon, with a new stepper with a large depth of focus specifically for the 200mm MEMS market. Though MEMS makers have traditionally used lower cost aligners to make their relatively large patterns, now finer features and tighter design rules may increasingly require the higher resolution and better alignment accuracy of steppers. But IC steppers are typically expensive and not well suited to the extreme topographies of MEMS. This Mini Stepper has ≤0.35µm overlay accuracy and resolution to 2µm, and depth of focus capabilities up to 26 µm for the thick resists and deformed substrates typical of MEMS, reports Junpei Fukui, Nikon Engineering assistant manager. It also offer flexible alignment to compensate for MEMS’ process-induced distortions, as well as alignment by pattern matching and backside marks.

These and other speakers including IDT, Hanking Electronics, Teledyne DALSA, Micralyne and NIST discuss solutions for growing the MEMS sector to the next level at SEMICON West, July 10 -12 in San Francisco. See http://semiconwest.org/Segments/MEMS for the complete agenda, and http://semiconwest.org/Participate/RegisterNow to register.

Read on for a SEMICON West preview from Doe on collaboration in the MEMS ecosystem.