Category Archives: Semiconductors

Cadence Design Systems, Inc. (NASDAQ: CDNS) today announced that it has received four TSMC Partner of the Year awards at this year’s TSMC Open Innovation Platform® (OIP) Ecosystem Forum. Cadence was presented with awards for the joint development of the 5nm design infrastructure, the cloud-based TSMC OIP Virtual Design Environment (VDE), the Wafer-on-Wafer (WoW) design solution, and its Tensilica® DSP IP.

These awards were given to Cadence based on the following work that has been delivered:

  • 5nm design infrastructure: Cadence participated in an early, in-depth collaboration with TSMC on the design infrastructure development of this latest advanced-node technology for next-generation system-on-chip (SoC) designs.
  • Cloud-based TSMC OIP VDE: Cadence was one of the first TSMC OIP Cloud Alliance partners and has collaborated with TSMC and mutual customers on successful tapeouts.
  • WoW design solution: Cadence collaborated with TSMC on the development of a design solution and delivered a reference flow that includes implementation, electrical analysis and physical verification
  • DSP IP: Cadence collaborated with TSMC on the delivery of Cadence® Tensilica DSP IP, the most widely-used DSP IP in the TSMC portfolio, which mutual customers use to complete successful projects.

“Through our ongoing collaboration with TSMC, we’ve jointly worked to stay in front of industry trends so that we can enable our mutual customers to consistently deliver successful designs through use of the latest technologies,” said Dr. Chin-Chi Teng, senior vice president and general manager of the Digital & Signoff Group at Cadence. “These awards from TSMC exemplify our ability to drive the industry forward with our innovations with 5nm, cloud, WoW, and DSP IP.”

“Our ongoing, in-depth collaboration with Cadence provides our customers with confidence that they can use the latest technologies and tools to deliver new innovations in competitive market windows,” said Suk Lee, senior director of the Design Infrastructure Marketing Division at TSMC. “We look forward to continuing to partner together on creative new solutions that our mutual customers can use to establish leadership in their respective markets.”

By Serena Brischetto

SEMI met with Heinz Martin Esser, managing director at Fabmatics GmbH, to discuss how existing 200mm semiconductor fabs can master the challenges of a 24×7 production under highest cost and quality pressure by implementing intralogistics automation solutions. The two spoke ahead to his presentation at the Fab Management Forum at SEMICON Europa 2018, 13-16, November 2018, in Munich, Germany. To register for the event, click here.

SEMI: Looking at the latest production capacity data for 2018 – it is a 200mm fab boom. Growing demand for analog, MEMS and RF chips continues to cause acute shortages for both 200mm fab capacity and equipment. Do you think this trend will continue the next years or is it only a short term run on 200mm fabs?

Esser: We at Fabmatics believe in a long-term trend. The emergence of the Internet of Things and growing digitalization in all areas of life will continue to increase demand for integrated circuits (ASICs), analog ICs, high-performance components and micro-mechanical sensors (MEMS) in the coming years. Many of these semiconductor elements should be produced in 200 mm fabs.

SEMI: How does Fab automation contribute to increase capacity of existing, mature 200mm fabs?

Esser:  We are convinced that fab automation is one of the greatest potentials for older 200mm factories to effectively master increased demand, increasing efficiency, quality assurance and flexibility at the same time. In particular, material flow automation, which is often the missing link between existing equipment in different production areas, can help increase productivity in an elementary way.

If you analyze how long valuable tools typically wait for loading and unloading, you can see a direct effect of the intralogistics automation system, which leads to a significantly higher utilization of process equipment by making the material flow independent from human performance. Additional side effects such as reduced cycle time, stable fab flow factor or flattened WIP shafts further increase the contribution of material flow automation to get the most out of existing mature factories. Older does not mean obsolete.

SEMI: What are the biggest challenges for a successful implementation?

Esser: There is no single challenge when you automate an existing mature fab. Instead, you face a whole variety of challenges you have to tackle, ranging from historically grown non-aligned fab layouts over non-linear material flows and older non-standardized equipment to “automation unfriendly” fab environment. Also you should not underestimate the efforts to overcome the practice manual fab operation people in the cleanroom are so familiar with for many years. Before doing automation you have to think automation, i.e. you have to question all processes to make them ready for automation.

SEMI: What are the key drivers to automate a mature fab today: costs, process stability, quality or a combination of them?

Esser: This question should be better asked to our customers, but we believe it is a mix of many impacts. Most likely everybody sees the cost reduction at first, but we get more aware of process and performance stability as well as quality requirements – and here our customers’ play the most important role – become more and more focused.

SEMI: What do you expect from SEMICON Europa 2018 and why do you recommend attending the Fab Management Forum?

Esser: This year SEMICON Europa will co-locate with electronica. So it`s going to be the greatest trade fair for electronics manufacturing in Europe. We will meet innovators and decision-makers across the whole electronics supply chain.

The Fab Management Forum addresses a highly topical question that concerns all semiconductor manufacturers not only in Europe – how to handle complexity and enable the necessary flexibility to cope with customers’ needs. High-ranking speakers will give an insight into the latest technologies and best practices. I am looking forward to the lively exchange with the participants and taking away new impulses for our business.

Heinz Martin Esser is managing director at Fabmatics GmbH, responsible for sales and marketing, customer service and administration. He studied supply engineering at the University of Applied Sciences in Cologne and later earned a university degree in business administration.

Originally published on the SEMI blog.

Semiconductors play increasingly important control roles in automotive, industrial and safety critical applications. Quality and reliability are therefore of vital importance and so Presto Engineering has completed certification to the ISO 9001:2015 quality standard at its facility in Caen, France, which is Europe’s largest independent semiconductor test facility.

“We have an extensive and comprehensive range of semiconductor test equipment,” said Dr Alban Colder, Presto’s Site Director at Caen. “This includes testing at every stage from wafer, through die, to final packed device. As part of the ISO 9001: 2015 quality standard, we have a comprehensive range of equipment for non-destructive analysis such as X-Ray to check packaging and bondings, and ultrasound to see inside a device to check for delamination, voids and cracked silicon. There is also equipment to check for failure localization by photoemission or thermal laser stimulation, and deep physical analysis, i.e. strip a device down layer by layer to see exactly where it is failing and why. Other advanced equipment such as an atomic force microscope or a scanning electron microscope are used to reveal the precise details of the structure of a chip down to a few nanometers.”

The key part of a quality system in semiconductors industry, is traceability. Detailed record keeping traces every wafer, every operation, every die and every test. Thus, in the event that there is a faulty chip in the field, it can be traced back to try and determine the cause and to see if any other chips have been affected that might necessitate a recall. In the case of an automotive recall, this could be very expensive so it is vital to be able to narrow the problem down to only the affected chips.

Martin Kingdon, Presto’s VP of Sales, added, “We have assembled a suite of state-of-the-art equipment as part of our commitment of quality and this new standard. We provide customers with a comprehensive service once they provide us with a design that covers every stage of the chip manufacturing and testing process right through to final product. As part of our quality assurance to customers, we rigorously test at every stage. Such a comprehensive test and failure analysis capability all together under one roof is very rare; usually it requires a number of different test houses which means that issues could be missed. Having all the skills and equipment together in one place means that we can keep searching until we find the cause of a problem so that it can be resolved and quality maintained.”

Mentor, a Siemens business, today announced it has qualified complete solutions from its Calibre® nmPlatform™, Analog FastSPICE™ (AFS)™ Platform, Eldo® Platform and Nitro-SoC place and route system for GLOBALFOUNDRIES’ 22FDX Fully-Depleted Silicon-On-Insulator (FD-SOI) integrated circuit (IC) manufacturing processes. GF and Mentor have mutually developed an advanced, first-of-its-kind automated fill flow that ensures analog devices are able to leverage the full performance of these new processes in emerging markets such as ADAS/autonomous driving, IoT, 5G communications, cloud computing and artificial intelligence.

“Mentor is pleased to be taking another step in our longstanding relationship with GF to deliver to our mutual customers solutions that help develop industry innovations,” said Ravi Subramanian, vice president and general manager, IC Verification Solutions, Mentor, a Siemens business. “The combined expertise of GF and Mentor gives designers the ability to develop innovative ICs for a broad number of applications.”

“Mentor has an extremely long history of partnership with GF, as Calibre’s first customer ever,” said Richard Trihy, senior director, Design Enablement at GF. “That partnership continues today with not only additional design kit certifications, but flows that help accelerate design fill efforts at a time when market windows are increasingly shorter.”

Mentor Calibre nmPlatform for GF’s 22FDX

Mentor has made enhancements across its Calibre nmPlatform for GF’s 22FDX process. One of the most significant of these is an industry-first, automated fill flow targeting both analog and radio frequency (RF) IP blocks and full chips. The new fill flow automates a task that previously required fabless design teams to manually develop custom scripts to perform fill effectively. The new flow combines Calibre PERC™, Calibre Pattern Matching and Calibre YieldEnhancer tool capabilities to create both net-aware and orientation-aware filling that results in consistent analog and RF performance independent of where the blocks are placed in the chip.

In addition, Mentor enhanced the Calibre nmDRC™ and Calibre nmLVS™ tools for GF’s 22FDX process. Mentor worked with GF to ensure appropriate coverage, and the two companies are collaborating to continuously optimize the Calibre design kits for runtime performance. At the same time, GF and Mentor worked together to make advanced process requirements transparent to mutual customers within the Calibre design rule checking (DRC) and multi-patterning software.

The Calibre xACTTM parasitic extraction tool is available for GF’s 22FDX process, allowing customers to efficiently balance the needs of high accuracy of critical structures along with high performance required for full chip signoff.

The Calibre PERC reliability platform is a verification solution for both IP and full-chip reliability analysis. Point-to-point and ESD current density reliability checks are critical for today’s complex, dense chip designs, but completing these checks on very large 22FDX designs requires scalability. GF and Mentor collaborated to enable a Calibre PERC solution leveraging a new multi-CPU run capability that allows mutual customers to more quickly find and resolve ESD reliability concerns in their designs.

The Calibre YieldEnhancer tool is certified for GF’s 22FDX processes. Mentor and GF are also jointly delivering enhanced use models that optimize fill runtimes, minimize shape removal caused by an engineering change order (ECO), and ensure consistency across all layers, intellectual property (IP) blocks and full-chip system-on-chips (SoCs) using fill-as-you-go methodologies.

Mentor AFS Platform and Eldo Platform for GF’s 22FDX

Mentor’s AFS Platform and Eldo Platform are supported in the GF 22FDX process. Mutual customers benefit from the AFS Platform (delivering fast, SPICE-accurate verification for the largest nanometer-scale circuits), and Eldo Platform (circuit verification for analog-centric circuits) to verify their chips designed for GF technologies.

Mentor Nitro SoC for GF 22FDX

Mentor’s Nitro SoC place and route system is certified for GF’s 22FDX process. In addition to support for 22FDX process rules, Mentor enhanced the Nitro SoC core engines to meet the new architecture requirements and design rules for this process. This enables Mentor to deliver an optimized digital implementation flow for the 22FDX node.

Technion, Israel’s technological institute, announced this week that Intel is collaborating with the institute on its new artificial intelligence (AI) research center. The announcement was made at the center’s inauguration attended by Dr. Michael Mayberry, Intel’s chief technology officer, and Dr. Naveen Rao, Intel corporate vice president and general manager of the Artificial Intelligence Products Group.

“AI is not a one-size-fits-all approach, and Intel has been working closely with a range of industry leaders to deploy AI capabilities and create new experiences. Our collaboration with Technion not only reinforces Intel Israel’s AI operations, but we are also seeing advancements to the field of AI from the joint research that is under way and in the pipeline,” said Naveen Rao, Intel corporate vice president and general manager of Artificial Intelligence Products Group

The center features Technion’s computer science, electrical engineering, industrial engineering and management departments, among others, all collaborating to drive a closer relationship between academia and industry in the race to AI. Intel, which invested undisclosed funds in the center, will represent the industry in leading AI-dedicated computing research.

Intel is committed to accelerating the promise of AI across many industries and driving the next wave of computing. Research exploring novel architectural and algorithmic approaches is a critical component of Intel’s overall AI program. The company is working with customers across verticals – including healthcare, autonomous driving, sports/entertainment, government, enterprise, retail and more – to implement AI solutions and demonstrate real value. Along with Technion, Intel is also involved in AI research with other universities and organizations worldwide.

Intel and Technion have enjoyed a strong relationship through the years, as generations of Technion graduates have joined Intel’s development center in Haifa, Israel, as engineers. Intel has also previously collaborated with Technion on AI as part of the Intel Collaborative Research Institute for Computational Intelligence program.

By Alan Weber

Even for someone who has been in this industry since the days of the TI Datamath 4-function calculator and the TMS1100 4-bit microcontroller (yes, that’s been a LONG time – the movie Grease premiered the same year!), it is sometimes hard to grasp the scope and complexity of what happens in today’s leading-edge semiconductor gigafabs. In fact, the only way to comprehend the enormous volume of transactions that occur is to consider what happens in a single minute – this is illustrated in the infographic we have labeled “The Gigafab Minute.”*

It’s amazing enough to think that a single factory can start 100,000 wafers every month on their cyclical journey through 1500 process steps… and have 99%+ of them emerge 4 months later to be delivered to packaging houses and then on to waiting customers. It’s quite another to realize that all of this happens continuously (24 x 7) and automatically.

“How is this possible?” you ask.

Well, a big part of the solution is the body of SEMI standards which have evolved since the early 80s to keep pace with the ever-changing demands of the industry. From an automation standpoint, many of these standards deal with the communications between manufacturing equipment and the factory information and control systems that are essential for managing these complex, hyper-competitive global enterprises.

A significant characteristic of these standards is that they have been carefully designed to be “additive.” This means that new generations of SEMI’s communications standards do not supplant or obsolete the previous generations, but rather provide new capabilities in an incremental fashion. To appreciate the importance of this in actual practice, consider how the GEM, GEM300, and EDA/Interface A standards support the transactions that occur in a single Gigafab Minute.

Starting at 1:00 o’clock on the infographic and moving clockwise, you first notice that 2.31 wafers enter the line. Of course, these are actually released in 25-wafer 300mm FOUPs (Front-Opening Unified Pod), but 100K wafers per month translates to 2.31 per minute. Since these factories run continuously, once the line is full, it stays full. And with an average total cycle time of 4 months, this means that there are 400K wafers of WIP (work in process) in the factory at any given time. This number, and the total number of equipment (5000+), drive the rest of the calculations.

GEM (Generic Equipment Model) – SEMI E30, etc.

The GEM messaging standards were initially defined in the early 90s to support the factory scheduling and dispatching applications that decide what lots should go to what equipment, the automated material handling systems that deliver and pick-up material to/from the equipment accordingly, the recipe management systems that ensure each process step is executed properly, and the MES (Manufacturing Execution System) transactions that maintain the fidelity of the factory system’s “digital twin.”

Every minute of every day, GEM messages support and chronicle the following activities: 240 process steps are completed (i.e., 240 25-wafer lots are processed), 300 recipes are downloaded along with a set of run-specific adjustable control parameters, and 600 FOUPs are moved from one place to another (equipment, stockers, under-track storage, etc.). For each of these activities, the factory’s MES is notified instantaneously.

GEM300 – SEMI E40, E87, E90, E94, E157

With the advent of 300mm manufacturing in the mid-to-late 90s, a global team of volunteer system engineers from the leading chip makers defined the GEM300 standards to support fully automated manufacturing operations. Starting at 5:00 o’clock on the infographic, the number of transactions per minute jumps almost 3 orders of magnitude, from the monitoring of 900 control jobs across 4000 process tools to the tracking of 360,000 individual recipe step change events. This level of event granularity is essential for the latest generation of FDC (Fault Detection and Classification) applications, because precise data framing is a key prerequisite for minimizing the false alarm rate while still preventing serious process excursions. In this context, more than 6000 recipe-, product- and chamber-specific fault models may be evaluated every minute.

Simultaneously, the applications that monitor instantaneous throughput to prevent “productivity excursions” and identify systemic “wait time waste” situations depend on detailed intra-tool wafer movement events. In a fab with hundreds of multi-chamber, single-wafer processes, 75,000 or more of these events occur every minute.

EDA (Equipment Data Acquisition) – SEMI E120, E125, E132, E134, E164, etc.

Rounding out the SEMI standards in our example gigafab is the suite of EDA standards which complement the command and control functions of GEM/GEM300 with flexible, high-performance, model-based data collection. The EDA standards enable the on-demand collection of the volume and variety of “big data” required from the equipment to support the advanced analysis, machine learning, and other AI (Artificial Intelligence) applications that are becoming increasingly prevalent in leading semiconductor manufacturers. As EUV (Extreme Ultraviolet) lithography moves from pilot production to high-volume manufacturing at the 7nm process node and beyond, the litho process area will become a major source of process data by itself, generating 10 GB of data every minute. This is in addition to the 100 GB of data collected from other process areas.

The End Result

The final wedge (12:00 o’clock) in our infographic highlights the real objective – which is producing the millions of integrated circuits that fuel our global economy and provide the technologies that are an integral part of our modern way of life. Assuming a nominal die size of 50 square mm (typical of an 8 GB DRAM), the 2.31 wafers we started at 1:00 o’clock result in almost 3200 individual chips. But none of this would be possible without the pervasive factory automation technology we now take for granted. So, as you finish reading this posting on whatever device you happen to be using, take a micro-moment to acknowledge and thank the hundreds of standards volunteers whose insights and efforts made this a reality!

You may not be responsible for running a gigafab anytime soon, but the SEMI standards used in this setting are no less applicable to any Smart Manufacturing environment. Give us a call if you’d like to know more about how these technologies can benefit your operations for many years to come.

Alan Weber is Vice President, New Product Innovations, at Cimetrix Incorporated. Previously he served on the Board of Directors for eight years before joining the company as a full-time employee in 2011. Alan has been a part of the semiconductor and manufacturing automation industries for over 40 years. He holds bachelor’s and master’s degrees in Electrical Engineering from Rice University.

Originally published on the SEMI blog.

On October 1, 2018 INFICON Inc. (SWX:IFCN), a supplier of vacuum instrumentation and process control software to the semiconductor manufacturing industry acquired all assets of Final Phase Systems (FPS) of Austin, Texas, USA.

Founded in 2009 by Industrial Engineers from AMD/Spansion’s Fab25, FPS has grown to a team of 22 employees who will now join the INFICON organization. Together, INFICON and FPS have developed the most comprehensive Industrial Engineering Software Suite available in the semiconductor manufacturing industry. With many successful deployments in the USA and across the globe, they have a proven track record of improving capital productivity and labor efficiency. By utilizing its software and techniques, their customers have been able to realize greater than 10% improvement in overall fab efficiency. In collaboration with the international SEMI organization, Final Phase Systems has established itself as a key player in the Smart Manufacturing initiative and serves as Co-chair of SEMI’s Smart Manufacturing Americas Chapter.

“The acquisition of FPS is the latest step in INFICON’s vision to provide the semiconductor and display manufacturing industries with the most advanced factory and process control tools available,” said Oliver Wyrsch, President, INFICON Inc. “The combined product offering will put INFICON in a unique position to provide the industry’s only end-to-end software solution for the fully connected Smart fab of the future.”

Engineers at The Australian National University (ANU) have invented a semiconductor with organic and inorganic materials that can convert electricity into light very efficiently, and it is thin and flexible enough to help make devices such as mobile phones bendable.

The invention also opens the door to a new generation of high-performance electronic devices made with organic materials that will be biodegradable or that can be easily recycled, promising to help substantially reduce e-waste.

The huge volumes of e-waste generated by discarded electronic devices around the world is causing irreversible damage to the environment. Australia produces 200,000 tonnes of e-waste every year – only four per cent of this waste is recycled.

The organic component has the thickness of just one atom – made from just carbon and hydrogen – and forms part of the semiconductor that the ANU team developed. The inorganic component has the thickness of around two atoms. The hybrid structure can convert electricity into light efficiently for displays on mobile phones, televisions and other electronic devices.

Lead senior researcher Associate Professor Larry Lu said the invention was a major breakthrough in the field.

“For the first time, we have developed an ultra-thin electronics component with excellent semiconducting properties that is an organic-inorganic hybrid structure and thin and flexible enough for future technologies, such as bendable mobile phones and display screens,” said Associate Professor Lu from the ANU Research School of Engineering.

PhD researcher Ankur Sharma, who recently won the ANU 3-Minute Thesis competition, said experiments demonstrated the performance of their semiconductor would be much more efficient than conventional semiconductors made with inorganic materials such as silicon.

“We have the potential with this semiconductor to make mobile phones as powerful as today’s supercomputers,” said Mr Sharma from the ANU Research School of Engineering.

“The light emission from our semiconducting structure is very sharp, so it can be used for high-resolution displays and, since the materials are ultra-thin, they have the flexibility to be made into bendable screens and mobile phones in the near future.”

The team grew the organic semiconductor component molecule by molecule, in a similar way to 3D printing. The process is called chemical vapour deposition.

“We characterised the opto-electronic and electrical properties of our invention to confirm the tremendous potential of it to be used as a future semiconductor component,” Associate Professor Lu said.

“We are working on growing our semiconductor component on a large scale, so it can be commercialised in collaboration with prospective industry partners.”

To scale down a transistor below a 5nm node is one of the vital concerns for VLSI industry as there are various challenges due to the shrinking of components. Several researches are going on worldwide to overcome the challenges of future technology nodes. Among them, this article reviews the potential transistor structures and materials like Carbon Nano-tube FET, Gate-All-Around FET, and Compound Semiconductors as solutions to overcome the problems of scaling the existing silicon FinFET transistor below 5nm node.

By Pavan H Vora, Akash Verma, Dhaval Parikh

The ‘Semiconductor era’ started in 1960 with the invention of the integrated circuit. In an integrated circuit, all the active-passive components and their interconnection are integrated on a single silicon wafer, offering numerous advantages in terms of portability, functionality, power, and performance. The VLSI industry is following Moore’s law for many decades, which says, “the number of transistors on a chip becomes double approximately every two years”. To get the benefits of a scaled-down transistor, VLSI industry is continuously improving transistor structure and material, manufacturing techniques, and tools for designing IC. Various techniques, which have been adopted for transistors so far, include high-K dielectric, metal gate, strained silicon, double patterning, controlling channel from more than one side, silicon on insulator and many more techniques. Some of these techniques are discussed in ‘A Review Paper on CMOS, SOI and FinFET Technology’[1].

Nowadays, the demand of the internet of things, autonomous vehicles, machine learning, artificial intelligence, and internet traffic is growing exponentially, which acts as a driving force for scaling down transistor below the existing 7nm node for higher performance. However, there are several challenges of scaling down a transistor size.

Issues with Sub-Micron Technology:

Every time we scale down a transistor size, a new technology node is generated. We have seen transistor sizes such as 28nm, 16nm, etc. Scaling down a transistor enables faster switching, higher density, low power consumption, lower cost per transistor, and numerous other gains. The CMOS (complementary metal-oxide-semiconductor) transistor base IC technology performs well up to 28nm node. However, the short channel effects become uncontrollable if we shrink down CMOS transistor below 28 nm. Below this node, a horizontal electric field generated by drain-source supply tries to govern the channel. As a result, the gate is unable to control leakage paths, which are far from the gate.

16nm/7nm Transistor Technology: FinFet and FD-SOI:

The VLSI industry has adopted FinFET and SOI transistor for 16nm and 7nm nodes, as both the structures are able to prevent the leakage issue at these nodes. The main objective of both the structures is to maximize gate-to-channel capacitance and minimize drain-to-channel capacitance[1]. In both transistor structures, the channel thickness scaling is introduced as the new scaling parameter. As the channel thickness is reduced, there are no paths, which are far from the gate area. Thus, gates have a good control over the channel, which eliminates short channel effects.

In Silicon-on-Insulator (SOI) transistor, a buried oxide layer is used, which isolates the body from the substrate shown in Figure 1(a).Owing to the BOX layer, drain-source parasitic junction capacitances are reduced, which results in faster switching. The main challenge with the SOI transistor is that it is difficult to manufacture a thin silicon layer on the wafer.

Figure 1: a) FD-SOI Structure b) FinFET Structure and Channel

FinFET, which is also called as tri-gate controls channel is shown from three sides in Figure 1(b).  There is a thin vertical Si-body, which looks like a back fin of fish wrapped by the gate structure. A width of the channel is almost two times Fin height. Thus, to get higher driving strength, a multi-Fin structure is used. One of the gains with FinFET is higher driving current. The main challenge with FinFET is the complex manufacturing process.

Challenges with Technology Node below 5nm: What Next?

Reducing the body thickness results into lower mobility as surface roughness scattering increases. Since FinFET is a 3-D structure, it is less efficient in terms of thermal dissipation. Also, if we scale down the FinFET transistor size further, say below 7nm, the leakage issue becomes dominant again. Consequently, many other problems come into consideration like self-heating, threshold flattening, etc. These concerns lead to research on other possible transistor structures and replacing existing materials with new effective materials.

According to the ITRS roadmap (International Technology Roadmap for Semiconductors), the next technology nodes are 5nm, 3nm, 2.5nm, and 1.5nm. Many different types of research and studies are going on in VLSI industry and academia for potential solutions to deal with these future technology nodes. Here we discuss some promising solutions like carbon nanotube FET, GAA transistor structure, and compound semiconductor for future technology nodes.

Figure 2: Transistor Technology Roadmap

CNTFET – Carbon Nano Tube FET:

CNT (Carbon Nanotube) showcases a new class of semiconductor material that consists of a single sheet of carbon atoms rolled up to form a tubular structure. CNTFET is a field-effect transistor (FET) that uses semiconducting CNT as a channel material between the two metal electrodes, which behave as source and drain contacts. Here we will discuss carbon nanotube material and how it is beneficial to FET at a lower technology node.

  • What is a Carbon Nanotube?

CNT is a tubular shaped material, made of carbon, having diameters measurable on the nanometer scale. They have a long and hollow structure and are formed from sheets of carbon that are one atom thick. It is called “Graphene”. Carbon nanotubes have varied structures, differing in length, thickness, helicity, and the number of layers. Majorly, they are classified as Single Walled Carbon Nanotube (SWCNT) and Multi-Walled Carbon Nanotube (MWCNT). As shown in Figure 3(a), one can see that SWCNTs are made up of a single layer of graphene, whereas MWCNTs are made up of multiple layers of graphene.

Figure 3: a) Single Walled and Multi Walled CNTs b) Chirality Vector Representation

  • Properties of Carbon Nanotube:

The carbon nanotube delivers excellent properties in areas of thermal and physical stability as discussed below:

  1. Both Metallic and Semiconductor Behavior

The CNT can exhibit metallic and semiconductor behavior. This change in behavior depends on the direction in which the graphene sheet is rolled. It is termed as chirality vector. This vector is denoted by a pair of integer (n, m) as shown in Figure 3(b). The CNT behaves as metallic if ‘n’ equals to ‘m’ or the difference of ‘n’ and ‘m’ is the integral multiple of three or else it behaves as a semiconductor [2].

  1. Incredible Mobility

SWCNTs have a great potential for application in electronics because of their capacity to behave as either metal or as a semiconductor, symmetric conduction and their capacity to carry large currents. Electrons and holes have a high current density along the length of a CNT due to the low scattering rates along the CNT axis. CNTs can carry current around 10 A/nm2, while standard metal wires have a current carrying capacity that is only around 10 nA/nm2[3].

  1. Excellent Heat Dissipation

Thermal management is an important parameter for the electronic devices’ performance. Carbon nanotubes (CNTs) are well-known nanomaterials for excellent heat dissipation. Moreover, they have a lesser effect of the rise in temperature on the I-V characteristics as compared to silicon [4].

CNT in Transistor Applications: CNFET

The bandgap of carbon nanotubes can be changed by its chirality and diameter and thus, the carbon nanotube can be made to behave like a semiconductor. Semiconducting CNTs can be a favorable candidate for nanoscale transistor devices for channel material as it offers numerous advantages over traditional silicon-MOSFETs. Carbon nanotubes conduct heat similar to the diamond or sapphire. Also, they switch more reliably and use much less power than silicon-based devices [5].

In addition, the CNFETS have four times higher trans-conductance than its counterpart. CNT can be integrated with a High-K material, which is offering good gate control over the channel. The carrier velocity of CNFET is twice as compared to MOSFET, due to increased mobility. A carrier mobility of N-type and P-type CNFET is similar in offering advantages in terms of same transistor size. In CMOS, PMOS (P-type metal-oxide-semiconductor) transistor size is approximately 2.5 times more than NMOS (N-type metal-oxide-semiconductor) transistor as mobility values are different.

The Fabrication process of CNTFET is a very challenging task as it requires precision and accuracy in the methodologies.Here we discuss the Top-gated CNTFET fabrication methodology.

The first step in this technique starts from the placement of carbon nanotubes onto the silicon oxide substrate. Then the individual tubes are isolated. Source and drain contacts are defined and patterned using advanced lithography. The contact resistance is then reduced by refining the connection between the contacts and CNT. The deposition of a thin top-gate dielectric is performed on the nanotube via evaporation technique. Lastly, to complete the process, the gate contact is deposited on the gate dielectric [6].

Figure 4: Concept of Carbon-Nanotube FET

Challenges of CNTFET:

There are lots of challenges in the roadmap of commercial CNFET technology.  Majority of them have been resolved to a certain level, but a few of them are yet to be overcome. Here we will discuss some of the major challenges of CNTFET.

  1. Contact Resistance

For any advanced transistor technology, the increase in contact resistance due to the low size of transistors becomes a major performance problem. The performance of the transistor degrades as the resistance of contacts increases significantly due to the scaling down of transistors. Until now, decreasing the size of the contacts on a device caused a huge drop in execution — a challenge facing both silicon and carbon nanotube transistor technologies [7].

  1. Synthesis of Nanotube

Another challenge with CNT is to change its chirality such that it behaves like a semiconductor. The synthesized tubes have a mixture of both metals and semiconductors. But, since only the semiconducting ones are useful for qualifying to be a transistor, engineering methodologies need to be invented to get a significantly better result at separating metal tubes from semiconducting tubes.

  1. To develop a non-lithographic process to place billions of these nanotubes onto the specific location of the chip poses a challenging task.

Currently, many engineering teams are carrying out research about CNTFET devices and their logic applications, both in the industries and in the universities. In the year 2015, researchers from one of the leading semiconductor companies succeeded in combining metal contacts with nanotubes using “close-bonded contact scheme”. They achieved this by putting a metal contact at the ends of the tube and making them react with the carbon to form different compounds. This technique helped them to shrink contacts below 10 nanometers without compromising the performance [8].

Gate-All-Around FET: GAAFET

One of the futuristic potential transistor structures is Gate-all-around FET. The Gate-all-around FETs are extended versions of FinFET. In GAAFET, the gate material surrounds the channel region from the four directions. In a simple structure, a silicon nanowire as a channel is wrapped by the gate structure. A vertically stacked multiple horizontal nanowires structure is proven excellent for boosting current per given area. This concept of multiple vertically stacked gate-all-around silicon nanowire is shown in Figure 5.

Figure 5: Vertically Stacked Nanowires GAAFET

Apart from silicon material, some other materials like InGaAs, germanium nanowires can also be utilized for better mobility.

There are many hurdles for GAAFET in terms of complex gate manufacturing, nanowires, and contacts. One of the challenging processes is fabricating nanowires from the silicon layer as it requires a new approach for the etching process.

There are many research labs and institute working for Gate-all-around FET for lower nodes. Recently, Leuven based R&D firm claimed that they achieved excellent electrostatic control over a channel with GAAFET at sub 10nm diameter nanowire. Last year, one of the leading semiconductor companies unveiled a 5nm chip, which contains 30 billion transistors on a 50mm2chip using stacked nanowire GAAFET technology. It claimed to achieve 40% improvement in performance compared to 10nm node or 70% improvement in power consumption at the same performance.

Compound Semiconductors:

Another promising way to scale down a transistor node is the selection of novel material that exhibits higher carrier mobility. A compound semiconductor with ingredients from columns III and V are having higher mobility compared to silicon. Some compound semiconductor examples are Indium Gallium Arsenide (InGaAs), Gallium Arsenide (GaAs), and Indium Arsenide (InAs). According to various studies, integration of compound semiconductor with FinFET and GAAFET showing excellent performance at lower nodes.

The main concerns with compound semiconductor are large lattice mismatch between silicon and III-V semiconductor, resulting in defects of the transistor channel. One of the firms developed a FinFET containing V-shaped trenches into the silicon substrate. These trenches filled with indium gallium arsenide and forming the fin of the transistor. The bottom of the trench is filled with indium phosphide to reduce the leakage current. With this trench structure, it has been observed that defects terminate at the trench walls, enabling lower defects in the channel.

Conclusion:

From the 22nm node to 7nm node, FinFETs have been proven successful and it may be scaled down to one more node. Beyond that, there are various challenges like self-heating, mobility degradation, threshold flattening, etc. We have discussed how carbon nanotube’s excellent properties of motilities, heat dissipation, high current carrying capability offer promising solutions for replacing existing silicon technology. As the stack of horizontal nanowire opened a “fourth gate”, Gate-all-around transistor structure is also a good candidate for replacing vertical Fin structure of FinFET for achieving good electrostatic property. It is not clear what comes next in the technology roadmap. However, in the futuristic transistor technology, there must be changes of existing material, structure, EUV (Extreme ultraviolet) lithography process, and packaging to sustain Moore’s law.

References:

[1]  Pavan Vora, Ronak Lad, “A Review Paper on CMOS, SOI and FinFET Technology”, www.design-reuse.com/articles/

[2]  P.A Gowri Sankar, K. Udhaya Kumar, “Investigating The Effect of Chirality On Coaxial Carbon Nanotube Field Effect Transistor”, 2012 International Conference on Computing, Electronics and Electrical Technologies (ICCEET)

[3] Rashmita Sahoo, S.K Sahoo, “Design of an efficient CNTFET using optimum number of CNT in channel region for logic gate implementation”, 2015 International Conference on VLSI Systems, Architecture, Technology and Applications (VLSI-SATA)

[4] Yijian Ouyang and Jing Guo, “Heat dissipation in carbon nanotube transistors”, Appl. Phys. Lett. 89, 183122 (2006)

[5] Philip G. Collins & Phaedon Avouris, “Nanotubes for Electronics”, Scientific American 283, 62 – 69 (2000)

[6] Wind, S. J.; Appenzeller, J.; Martel, R.; Derycke, V.; Avouris, Ph. (2002). “Vertical scaling of carbon nanotube field-effect transistors using top gate electrodes”, Applied Physics Letters. 80 (20): 3817. Bibcode:2002ApPhL..80.3817W.

[7] Aaron D. Franklin, Wilfried Haensch, “Defining and overcoming the contact resistance challenge in scaled carbon nanotube transistors”, 72nd Device Research Conference

[8] IBM, “IBM Research Breakthrough Paves Way for Post-Silicon Future with Carbon Nanotube Electronics”, https://www-03.ibm.com/press/us/en/pressrelease/47767.wss

About Authors:

Pavan Vora

Pavan Vora is working as an ASIC Physical Design Engineer at eInfochips, an Arrow company. He has more than 3 years of experience in ASIC designs for cutting technology nodes such as 12nm, 16nm FinFET, and 28nm. Pavan has expertise in ASIC P&R, LEC, LVS, Static Timing Analysis, Signal EM, DRC, and IR drop and has been awarded a Gold Medal in Master of Engineering in VLSI System Design.

Akash Verma

Akash Verma is working as an ASIC Trainee Engineer at eInfochips, an Arrow company. He has completed his bachelors in Electronics & Communication from the GIT, Gandhinagar. He is currently working on networking ASIC chip at 7nm FinFET technology, in which his accountabilities include block level APR, Static Timing Analysis and Physical Verification. His interest lies in Analog Mixed Signal designs and EDA tool’s algorithmic methodologies.

Dhaval Parikh

Dhaval Parikh is working as a Technical Manager at eInfochips, an Arrow company. He has more than 11 years of industry experience and has worked in various ASIC designs of IP’s & SoC’s, from 180nm to cutting technology node 7nm. He has been responsible for all the aspects of physical design and verification along with executing multiple projects simultaneously.

About eInfochips:

eInfochips, an Arrow company, is a global provider of product engineering and semiconductor design services. With over 500+ products developed and 40M deployments in 140 countries, eInfochips continues to fuel technological innovations in multiple verticals. The company’s service offerings include digital transformation and connected IoT solutions across various cloud platforms, including AWS and Azure.

Along with Arrow’s $27B in revenues, 19,000 employees, and 345 locations serving over 80 countries, eInfochips is primed to accelerate connected products innovation for 150,000+ global clients. eInfochips acts as a catalyst to Arrow’s Sensor-to-Sunset initiative and offers complete edge-to-cloud capabilities for its clients through Arrow Connect.

The American Institute for Manufacturing Integrated Photonics (AIM Photonics) and Analog Photonics (AP) today announced the release of the AP SUNY Process Design Kit v2.5a (APSUNY_PDKv2.5a). In this latest release, Analog Photonics (AP) expanded the comprehensive set of Silicon Photonics Integrated Circuit (PIC) component libraries within SUNY Poly’s process capabilities to address the needs for O+C+L band applications. Combined with Multi-Project Wafer (MPW) runs, this updated PDK will give AIM Photonics’ members access to world-class silicon photonics components for the development of optical transceivers or systems used in all levels within data centers and high-performance computers.

The Silicon Photonics PDK includes design guide, design rule check deck, technology files, active and passive component documentation, abstracts, schematics, and compact models for the development of PICs.

The key features of the APSUNY_PDKv2.5a are:

  • O Band modulation, detection and coupling support.
  • C+L Band modulation, detection, filtering, switching, monitoring and coupling support.
  • Single-level and Multi-level modulation format support at 50Gbps, namely NRZ and PAM-4.
  •    Continued multi-vendor Electronics-Photonics-Design-Automation (EPDA) support with integrated EPDA PDK flow for hierarchical design and system-level simulation.

“We are thrilled to continue to expand the offerings of our state-of-the-art PDK to meet the needs of our more than 100 signed partners and other interested collaborators who can gain access to our unique capabilities. This also dovetails perfectly with our effort to efficiently process our Multi-Project Wafers (MPW’s) in the fab, with processing time decreasing from 130 days in 2016 to fewer than 90 days as we simultaneously add additional mask levels and functionality and continue to achieve world-class quality,” said Dr. Michael Liehr, AIM Photonics CEO and SUNY Poly Executive Vice President for Innovation and Technology.

The combined APSUNY_PDKv2.5a and MPW offering provides unmatched access to PIC systems for companies who desire a reduction in the time to market, product development risk, and investment.  By incorporating the design, verification, and process development within the PDK, interested organizations can rapidly modify their designs while reducing cost.

“The IEEE standards and multi-source-agreements (MSAs) for communications compatibility are key for our PDK component library. These standards require optical components to operate at O band (1260nm-to-1360nm), C band (1530nm-to-1565nm) and L band (1565nm-to-1625nm). With the PDKv2.5a component library, we are enabling components that cover all these bands in a single fabrication flow, and we look forward to the advancement of this library while innovating to meet industry needs,” said Director of PDK Development at Analog Photonics, Dr. Erman Timurdogan.

In the near future, the PDK will be empowered by laser and CMOS integration with an interposer, a capability that will be made possible at AIM Photonics’ Test, Assembly, and Packaging (TAP) facility, located in Rochester, NY. Additional releases of the AP SUNY Process Design Kit are planned over the next several years each quarter, with improved statistical models, optical components, and PIC systems.

“We are seeing customers take advantage of our repeatedly characterized and proven devices in the APSUNY PDK. With this valuable resource, which is validated on our 300mm advanced  semiconductor toolset, customers are able to rapidly address global standards, shrink their design sizes, and most importantly, reduce their time to market,” said AIM Photonics Design Center Offering Director Barton Bergman.

AIM Photonics is leveraging SUNY Poly’s state-of-the-art facilities for three total full-build/passive MPW runs that incorporate the PDK updates, with an interposer MPW run anticipated later in 2018. To ensure space for all interested parties, AIM Photonics is accepting reservations for these MPW runs. Those interested in participating in any of the AIM Photonics 2018 MPW silicon photonics runs should contact Chandra Cotter at [email protected] in order to guarantee a spot on these exciting new silicon photonics offerings. Interested parties can also sign up for the 2018 runs by visiting the initiative’s website at the following link: http://www.aimphotonics.com/mpw-schedule/

PDK and MPW fab access is solely available through the AIM Photonics MPW aggregator, MOSIS. Please contact MOSIS for access to the most current PDK version release at the following link: www.mosis.com/vendors/view/AIM.